Presentation 2012-10-25
Electromagnetic Simulation of Radiation Efficiency for On-Chip Dipole/Loop/Patch/ Antennas on a Si CMOS Substrate
Takuichi HIRANO, Kenichi OKADA, Jiro HIROKAWA, Makoto ANDO,
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Abstract(in English) Electromagnetic simulation of radiation efficiency for on-chip dipole, loop and patch antennas were performed. It was confirmed that the equivalent material property of a well layer can be expressed with uniform material with conductivity of 10^5S/m and thickness of 1μm. It was also found that high radiation efficiency can be obtained when the conductivity of a silicon substrate is smaller than 0.1S/m, or resistivity of 1kΩcm. The conductor loss is dominant in a patch antenna, and it can be neglected when the height between a patch and ground plane is larger than 100μm.
Keyword(in Japanese) (See Japanese page)
Keyword(in English) Si CMOS / Millimeter-wave / On-chip antenna / Dipole antenna / Loop antenna / Patch antenna / Radiation efficiency / Electromagnetic simulation
Paper # EMCJ2012-73,EST2012-57
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Committee EST
Conference Date 2012/10/18(1days)
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Registration To Electronic Simulation Technology (EST)
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) Electromagnetic Simulation of Radiation Efficiency for On-Chip Dipole/Loop/Patch/ Antennas on a Si CMOS Substrate
Sub Title (in English)
Keyword(1) Si CMOS
Keyword(2) Millimeter-wave
Keyword(3) On-chip antenna
Keyword(4) Dipole antenna
Keyword(5) Loop antenna
Keyword(6) Patch antenna
Keyword(7) Radiation efficiency
Keyword(8) Electromagnetic simulation
1st Author's Name Takuichi HIRANO
1st Author's Affiliation Graduate School of Science and Engineering, Tokyo Institute of Technology()
2nd Author's Name Kenichi OKADA
2nd Author's Affiliation Graduate School of Science and Engineering, Tokyo Institute of Technology
3rd Author's Name Jiro HIROKAWA
3rd Author's Affiliation Graduate School of Science and Engineering, Tokyo Institute of Technology
4th Author's Name Makoto ANDO
4th Author's Affiliation Graduate School of Science and Engineering, Tokyo Institute of Technology
Date 2012-10-25
Paper # EMCJ2012-73,EST2012-57
Volume (vol) vol.112
Number (no) 257
Page pp.pp.-
#Pages 6
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