Presentation 2012-10-25
LECCS-core Model Representing the Effect of Fluctuations in Supply Voltage by High-Frequency Current
Ayumu IZUHARA, Teruyoshi YAMASAKI, Tohlu MATSUSHIMA, Takashi HISAKADO, Osami WADA,
PDF Download Page PDF download Page Link
Abstract(in Japanese) (See Japanese page)
Abstract(in English) For simulating high-frequency power-supply currents generated by an LSI chip, EMC macro-model called LECCS model composed of a linear equivalent circuit and internal equivalent current sources was proposed. This LECCS model has been extracted in the condition that supply voltage remains steady. However, supply voltage fluctuates depending on the high-frequency currents on the power distribution network (PDN). In this report, the authors propose a modeling method in which a LECCS model for each block unit is extracted from the design information of the LSI and the sub-block models are combined to construct a functional block model with the internal equivalent current sources representing the effect of fluctuations in supply voltage. Applying this method to a test chip designed by the authors, the LECCS model expresses high-frequency currents with good accuracy.
Keyword(in Japanese) (See Japanese page)
Keyword(in English) EMC macro-model / high-frequency current / LECCS-core model / internal equivalent current source / supply voltage fluctuation
Paper # EMCJ2012-69,EST2012-53
Date of Issue

Conference Information
Committee EST
Conference Date 2012/10/18(1days)
Place (in Japanese) (See Japanese page)
Place (in English)
Topics (in Japanese) (See Japanese page)
Topics (in English)
Chair
Vice Chair
Secretary
Assistant

Paper Information
Registration To Electronic Simulation Technology (EST)
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) LECCS-core Model Representing the Effect of Fluctuations in Supply Voltage by High-Frequency Current
Sub Title (in English)
Keyword(1) EMC macro-model
Keyword(2) high-frequency current
Keyword(3) LECCS-core model
Keyword(4) internal equivalent current source
Keyword(5) supply voltage fluctuation
1st Author's Name Ayumu IZUHARA
1st Author's Affiliation Department of Electrical Engineering, Kyoto University()
2nd Author's Name Teruyoshi YAMASAKI
2nd Author's Affiliation Department of Electrical Engineering, Kyoto University
3rd Author's Name Tohlu MATSUSHIMA
3rd Author's Affiliation Department of Electrical Engineering, Kyoto University
4th Author's Name Takashi HISAKADO
4th Author's Affiliation Department of Electrical Engineering, Kyoto University
5th Author's Name Osami WADA
5th Author's Affiliation Department of Electrical Engineering, Kyoto University
Date 2012-10-25
Paper # EMCJ2012-69,EST2012-53
Volume (vol) vol.112
Number (no) 257
Page pp.pp.-
#Pages 6
Date of Issue