Presentation | 2012-10-25 LECCS-core Model Representing the Effect of Fluctuations in Supply Voltage by High-Frequency Current Ayumu IZUHARA, Teruyoshi YAMASAKI, Tohlu MATSUSHIMA, Takashi HISAKADO, Osami WADA, |
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Abstract(in Japanese) | (See Japanese page) |
Abstract(in English) | For simulating high-frequency power-supply currents generated by an LSI chip, EMC macro-model called LECCS model composed of a linear equivalent circuit and internal equivalent current sources was proposed. This LECCS model has been extracted in the condition that supply voltage remains steady. However, supply voltage fluctuates depending on the high-frequency currents on the power distribution network (PDN). In this report, the authors propose a modeling method in which a LECCS model for each block unit is extracted from the design information of the LSI and the sub-block models are combined to construct a functional block model with the internal equivalent current sources representing the effect of fluctuations in supply voltage. Applying this method to a test chip designed by the authors, the LECCS model expresses high-frequency currents with good accuracy. |
Keyword(in Japanese) | (See Japanese page) |
Keyword(in English) | EMC macro-model / high-frequency current / LECCS-core model / internal equivalent current source / supply voltage fluctuation |
Paper # | EMCJ2012-69,EST2012-53 |
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Committee | EST |
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Conference Date | 2012/10/18(1days) |
Place (in Japanese) | (See Japanese page) |
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Topics (in Japanese) | (See Japanese page) |
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Paper Information | |
Registration To | Electronic Simulation Technology (EST) |
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Language | JPN |
Title (in Japanese) | (See Japanese page) |
Sub Title (in Japanese) | (See Japanese page) |
Title (in English) | LECCS-core Model Representing the Effect of Fluctuations in Supply Voltage by High-Frequency Current |
Sub Title (in English) | |
Keyword(1) | EMC macro-model |
Keyword(2) | high-frequency current |
Keyword(3) | LECCS-core model |
Keyword(4) | internal equivalent current source |
Keyword(5) | supply voltage fluctuation |
1st Author's Name | Ayumu IZUHARA |
1st Author's Affiliation | Department of Electrical Engineering, Kyoto University() |
2nd Author's Name | Teruyoshi YAMASAKI |
2nd Author's Affiliation | Department of Electrical Engineering, Kyoto University |
3rd Author's Name | Tohlu MATSUSHIMA |
3rd Author's Affiliation | Department of Electrical Engineering, Kyoto University |
4th Author's Name | Takashi HISAKADO |
4th Author's Affiliation | Department of Electrical Engineering, Kyoto University |
5th Author's Name | Osami WADA |
5th Author's Affiliation | Department of Electrical Engineering, Kyoto University |
Date | 2012-10-25 |
Paper # | EMCJ2012-69,EST2012-53 |
Volume (vol) | vol.112 |
Number (no) | 257 |
Page | pp.pp.- |
#Pages | 6 |
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