Presentation | 2012-08-23 Random-Number-Generation Using a VCSEL's Frequency Noise Characteristic Kohei KAWAKAMI, Shinya MAEHARA, Kohei DOI, Hideaki ARAI, Takanobu KONDO, Naoya SHIMIZU, Takashi SATO, Shuichi SAKAMOTO, Yasuo OHDAIRA, Masashi OHKAWA, |
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Abstract(in Japanese) | (See Japanese page) |
Abstract(in English) | The pseudo-random number is normally used for large-scale simulation and encryption of communication. On the other hand, the physical-random number is recently expected to be used in these fields because it has no calculable periodicity and so makes the safer cipher. Therefore, many fast physical-random number generations, which use the wide intensity noise characteristic of a diode laser, have been reported. Because the diode laser has very fast frequency noise, we propose the method using it here. |
Keyword(in Japanese) | (See Japanese page) |
Keyword(in English) | Laser diode / Physical-random number / Frequency noise / Cryptographic application |
Paper # | R2012-22,EMD2012-28,CPM2012-53,OPE2012-60,LQE2012-26 |
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Conference Information | |
Committee | LQE |
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Conference Date | 2012/8/16(1days) |
Place (in Japanese) | (See Japanese page) |
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Topics (in Japanese) | (See Japanese page) |
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Paper Information | |
Registration To | Lasers and Quantum Electronics (LQE) |
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Language | JPN |
Title (in Japanese) | (See Japanese page) |
Sub Title (in Japanese) | (See Japanese page) |
Title (in English) | Random-Number-Generation Using a VCSEL's Frequency Noise Characteristic |
Sub Title (in English) | |
Keyword(1) | Laser diode |
Keyword(2) | Physical-random number |
Keyword(3) | Frequency noise |
Keyword(4) | Cryptographic application |
1st Author's Name | Kohei KAWAKAMI |
1st Author's Affiliation | Sato Lab., Graduate School of Science and Technology, Niigata University() |
2nd Author's Name | Shinya MAEHARA |
2nd Author's Affiliation | Faculty of Engineering, Niigata University |
3rd Author's Name | Kohei DOI |
3rd Author's Affiliation | Niigata University Gender Equality Office |
4th Author's Name | Hideaki ARAI |
4th Author's Affiliation | Sato Lab., Graduate School of Science and Technology, Niigata University |
5th Author's Name | Takanobu KONDO |
5th Author's Affiliation | Sato Lab., Graduate School of Science and Technology, Niigata University |
6th Author's Name | Naoya SHIMIZU |
6th Author's Affiliation | Sato Lab., Graduate School of Science and Technology, Niigata University |
7th Author's Name | Takashi SATO |
7th Author's Affiliation | Faculty of Engineering, Niigata University |
8th Author's Name | Shuichi SAKAMOTO |
8th Author's Affiliation | Faculty of Engineering, Niigata University |
9th Author's Name | Yasuo OHDAIRA |
9th Author's Affiliation | Faculty of Engineering, Niigata University |
10th Author's Name | Masashi OHKAWA |
10th Author's Affiliation | Faculty of Engineering, Niigata University |
Date | 2012-08-23 |
Paper # | R2012-22,EMD2012-28,CPM2012-53,OPE2012-60,LQE2012-26 |
Volume (vol) | vol.112 |
Number (no) | 184 |
Page | pp.pp.- |
#Pages | 4 |
Date of Issue |