Presentation 2012-08-23
Random-Number-Generation Using a VCSEL's Frequency Noise Characteristic
Kohei KAWAKAMI, Shinya MAEHARA, Kohei DOI, Hideaki ARAI, Takanobu KONDO, Naoya SHIMIZU, Takashi SATO, Shuichi SAKAMOTO, Yasuo OHDAIRA, Masashi OHKAWA,
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Abstract(in English) The pseudo-random number is normally used for large-scale simulation and encryption of communication. On the other hand, the physical-random number is recently expected to be used in these fields because it has no calculable periodicity and so makes the safer cipher. Therefore, many fast physical-random number generations, which use the wide intensity noise characteristic of a diode laser, have been reported. Because the diode laser has very fast frequency noise, we propose the method using it here.
Keyword(in Japanese) (See Japanese page)
Keyword(in English) Laser diode / Physical-random number / Frequency noise / Cryptographic application
Paper # R2012-22,EMD2012-28,CPM2012-53,OPE2012-60,LQE2012-26
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Conference Information
Committee LQE
Conference Date 2012/8/16(1days)
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Registration To Lasers and Quantum Electronics (LQE)
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) Random-Number-Generation Using a VCSEL's Frequency Noise Characteristic
Sub Title (in English)
Keyword(1) Laser diode
Keyword(2) Physical-random number
Keyword(3) Frequency noise
Keyword(4) Cryptographic application
1st Author's Name Kohei KAWAKAMI
1st Author's Affiliation Sato Lab., Graduate School of Science and Technology, Niigata University()
2nd Author's Name Shinya MAEHARA
2nd Author's Affiliation Faculty of Engineering, Niigata University
3rd Author's Name Kohei DOI
3rd Author's Affiliation Niigata University Gender Equality Office
4th Author's Name Hideaki ARAI
4th Author's Affiliation Sato Lab., Graduate School of Science and Technology, Niigata University
5th Author's Name Takanobu KONDO
5th Author's Affiliation Sato Lab., Graduate School of Science and Technology, Niigata University
6th Author's Name Naoya SHIMIZU
6th Author's Affiliation Sato Lab., Graduate School of Science and Technology, Niigata University
7th Author's Name Takashi SATO
7th Author's Affiliation Faculty of Engineering, Niigata University
8th Author's Name Shuichi SAKAMOTO
8th Author's Affiliation Faculty of Engineering, Niigata University
9th Author's Name Yasuo OHDAIRA
9th Author's Affiliation Faculty of Engineering, Niigata University
10th Author's Name Masashi OHKAWA
10th Author's Affiliation Faculty of Engineering, Niigata University
Date 2012-08-23
Paper # R2012-22,EMD2012-28,CPM2012-53,OPE2012-60,LQE2012-26
Volume (vol) vol.112
Number (no) 184
Page pp.pp.-
#Pages 4
Date of Issue