Presentation 2012-08-02
Design Technology of stacked Type Chain PRAM Readout
Sho KATO, Shigeyoshi WATANABE,
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Abstract(in English) Stacked type chain PRAM which enables to realize lower cost than NAND flash memory has been newly proposed. Cell structure, core circuit, and the design method for realizing stable read and write operation for the stacked type chain PRAM have been described. The newly proposed stacked type chain PRAM is apromising candidate for realizing high-speed, low-cost, future non-volatile semiconductor memory.
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Keyword(in English) Non-volatile memory / PRAM / phase change material / Chain structure
Paper # SDM2012-76,ICD2012-44
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Conference Date 2012/7/26(1days)
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Registration To Integrated Circuits and Devices (ICD)
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) Design Technology of stacked Type Chain PRAM Readout
Sub Title (in English)
Keyword(1) Non-volatile memory
Keyword(2) PRAM
Keyword(3) phase change material
Keyword(4) Chain structure
1st Author's Name Sho KATO
1st Author's Affiliation Department of Information Science, Shonan Institute of Technology()
2nd Author's Name Shigeyoshi WATANABE
2nd Author's Affiliation Department of Information Science, Shonan Institute of Technology
Date 2012-08-02
Paper # SDM2012-76,ICD2012-44
Volume (vol) vol.112
Number (no) 170
Page pp.pp.-
#Pages 6
Date of Issue