Presentation 2012-08-24
Modeling for Semiconductor Characteristics of Electrical Contact Resistance between Rail and Wheel
Takashi TOYAMA, Mitsuyoshi FUKUDA, Kosuke OWADA, Hiroyuki FUJITA,
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Abstract(in English) In railway signalling systems, track circuits based on an electrical shunting principle are used to detect the presence of a train within a particular track section. An increase of contact resistances between rail and wheel makes the detection difficult. Therefore, it is important to quantitatively estimate the contact resistances in order to detect trains exactly. The contact resistances may behave like semiconductors, but their semiconductor characteristics have not been sufficiently studied for the quantitative estimation. In this paper, we propose electrical-circuit models for the semiconductor characteristics, and show their performance based on comparison with measurement data.
Keyword(in Japanese) (See Japanese page)
Keyword(in English) Railway Signalling / Wheel-rail Contact / Shunting Malfunction / Contact Resistance / Rust
Paper # R2012-53,EMD2012-59,CPM2012-84,OPE2012-91,LQE2012-57
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Committee CPM
Conference Date 2012/8/16(1days)
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Registration To Component Parts and Materials (CPM)
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) Modeling for Semiconductor Characteristics of Electrical Contact Resistance between Rail and Wheel
Sub Title (in English)
Keyword(1) Railway Signalling
Keyword(2) Wheel-rail Contact
Keyword(3) Shunting Malfunction
Keyword(4) Contact Resistance
Keyword(5) Rust
1st Author's Name Takashi TOYAMA
1st Author's Affiliation Railway Technical Research Institute()
2nd Author's Name Mitsuyoshi FUKUDA
2nd Author's Affiliation Railway Technical Research Institute
3rd Author's Name Kosuke OWADA
3rd Author's Affiliation Railway Technical Research Institute
4th Author's Name Hiroyuki FUJITA
4th Author's Affiliation Railway Technical Research Institute
Date 2012-08-24
Paper # R2012-53,EMD2012-59,CPM2012-84,OPE2012-91,LQE2012-57
Volume (vol) vol.112
Number (no) 182
Page pp.pp.-
#Pages 6
Date of Issue