| Presentation | 2012-08-23 Reliability of 1060 nm Vertical Cavity Surface Emitting Lasers (VCSELs) for Optical Interconnect Shinichi KAMIYA, Suguru IMAI, Masaki FUNABASHI, Toshihito SUZUKI, Koji HIRAIWA, Tomofumi KISE, Teruyuki NAKAMURA, Hitoshi SHIMIZU, Takuya ISHIKAWA, Akihiko KASUKAWA, |
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| PDF Download Page |  PDF download Page Link |
| Abstract(in Japanese) | (See Japanese page) |
| Abstract(in English) | We report our 1060 nm Vertical Cavity Surface Emitting Lasers (VCSELs) with high reliability. Through high temperature aging tests on about 5,000 devices, the fit rate as small as 30 FITs/ch was obtained for the random failure. And, the wear-out tests at very high temperature of 170 ℃ and lower temperature of 90 ℃ have proved that the median life of our VCSELs is as long as 300 years at 40 ℃. |
| Keyword(in Japanese) | (See Japanese page) |
| Keyword(in English) | High Reliability / VCSEL / Optical Interconnect / Low Power Consumption |
| Paper # | R2012-28,EMD2012-34,CPM2012-59,OPE2012-66,LQE2012-32 |
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| Conference Information | |
| Committee | CPM |
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| Conference Date | 2012/8/16(1days) |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | |
| Topics (in Japanese) | (See Japanese page) |
| Topics (in English) | |
| Chair | |
| Vice Chair | |
| Secretary | |
| Assistant | |
| Paper Information | |
| Registration To | Component Parts and Materials (CPM) |
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| Language | JPN |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | Reliability of 1060 nm Vertical Cavity Surface Emitting Lasers (VCSELs) for Optical Interconnect |
| Sub Title (in English) | |
| Keyword(1) | High Reliability |
| Keyword(2) | VCSEL |
| Keyword(3) | Optical Interconnect |
| Keyword(4) | Low Power Consumption |
| 1st Author's Name | Shinichi KAMIYA |
| 1st Author's Affiliation | Reliability First Group, Furukawa Electric Co., Ltd.() |
| 2nd Author's Name | Suguru IMAI |
| 2nd Author's Affiliation | Photonic Device Research Center, Furukawa Electric Co., Ltd. |
| 3rd Author's Name | Masaki FUNABASHI |
| 3rd Author's Affiliation | Photonic Device Research Center, Furukawa Electric Co., Ltd. |
| 4th Author's Name | Toshihito SUZUKI |
| 4th Author's Affiliation | Photonic Device Research Center, Furukawa Electric Co., Ltd. |
| 5th Author's Name | Koji HIRAIWA |
| 5th Author's Affiliation | Photonic Device Research Center, Furukawa Electric Co., Ltd. |
| 6th Author's Name | Tomofumi KISE |
| 6th Author's Affiliation | Photonic Device Research Center, Furukawa Electric Co., Ltd. |
| 7th Author's Name | Teruyuki NAKAMURA |
| 7th Author's Affiliation | Photonic Device Research Center, Furukawa Electric Co., Ltd. |
| 8th Author's Name | Hitoshi SHIMIZU |
| 8th Author's Affiliation | Photonic Device Research Center, Furukawa Electric Co., Ltd. |
| 9th Author's Name | Takuya ISHIKAWA |
| 9th Author's Affiliation | Photonic Device Research Center, Furukawa Electric Co., Ltd. |
| 10th Author's Name | Akihiko KASUKAWA |
| 10th Author's Affiliation | Reliability First Group, Furukawa Electric Co., Ltd. |
| Date | 2012-08-23 |
| Paper # | R2012-28,EMD2012-34,CPM2012-59,OPE2012-66,LQE2012-32 |
| Volume (vol) | vol.112 |
| Number (no) | 182 |
| Page | pp.pp.- |
| #Pages | 4 |
| Date of Issue | |