| Presentation | 2012-08-23 Improvement in Reliability of AlGaInAs Edge-Emitting Laser Diodes Hiroyuki ICHIKAWA, Yasuo YAMASAKI, Nobuyuki IKOMA, |
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| PDF Download Page |  PDF download Page Link |
| Abstract(in Japanese) | (See Japanese page) |
| Abstract(in English) | High-speed and high-temperature operations are required for light emitters in optical communication systems. AlGaInAs lasers are better suited for this purpose than GaInAsP lasers. However, degradations in forward-biased ESD tests and accelerated aging tests were found. Since both degradations occurred at the facet of the laser, we improved facet-coating processes. In forward-biased ESD tests, we introduced a passivation of an Al ultrathin layer just before facet-coating. The Al ultrathin layer prevents oxidation of the facet from oxygen atmosphere. The degradation ratio of 1 kV ESD tests was decreased from 40% to 0% by introducing the passivation. In accelerated aging tests of 200 mA at 85 ℃, we introduced facet-coating with compressive strain. This degradation differed completely from that caused by ESD; dislocation loops covered the entire active layer at the facet. The degradation ratio of 800 h aging was decreased from 5% to 0% by introducing the compressively strained facet-coating. |
| Keyword(in Japanese) | (See Japanese page) |
| Keyword(in English) | AlGaInAs / Laser / Facet-coating / ESD / Reliability |
| Paper # | R2012-27,EMD2012-33,CPM2012-58,OPE2012-65,LQE2012-31 |
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| Conference Information | |
| Committee | CPM |
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| Conference Date | 2012/8/16(1days) |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | |
| Topics (in Japanese) | (See Japanese page) |
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| Paper Information | |
| Registration To | Component Parts and Materials (CPM) |
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| Language | JPN |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | Improvement in Reliability of AlGaInAs Edge-Emitting Laser Diodes |
| Sub Title (in English) | |
| Keyword(1) | AlGaInAs |
| Keyword(2) | Laser |
| Keyword(3) | Facet-coating |
| Keyword(4) | ESD |
| Keyword(5) | Reliability |
| 1st Author's Name | Hiroyuki ICHIKAWA |
| 1st Author's Affiliation | Transmission Devices R&D Laboratories, Sumitomo Electric Industries, Ltd.:Analysis Technology Reserch Center, Sumitomo Electric Industries, Ltd.() |
| 2nd Author's Name | Yasuo YAMASAKI |
| 2nd Author's Affiliation | Sumitomo Electric Device Innovations, Inc. |
| 3rd Author's Name | Nobuyuki IKOMA |
| 3rd Author's Affiliation | Sumitomo Electric Device Innovations, Inc. |
| Date | 2012-08-23 |
| Paper # | R2012-27,EMD2012-33,CPM2012-58,OPE2012-65,LQE2012-31 |
| Volume (vol) | vol.112 |
| Number (no) | 182 |
| Page | pp.pp.- |
| #Pages | 4 |
| Date of Issue | |