Presentation | 2012-08-23 Study on Reliability of Semiconductor Optical Devices : General Remarks and Topics since the Early 1990s Osamu UEDA, |
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Abstract(in Japanese) | (See Japanese page) |
Abstract(in English) | Semiconductor optical devices come in a variety of materials and structures, and they are used in an extremely wide range of fields such as light sources in medium to high capacity fiber optic communications systems, audio and digital systems, as well as being used in sensing systems and medical equipment. It would thus be no exaggeration to say that improving the reliability of optical devices is essential to the development of high-performance, highly reliable products. That is why vigorous reliability studies have been conducted from the very outset, early 1970s, and to the present day. This paper first outlines the three main degradation modes for optical devices, then presents topics in the reliability research that was carried out since the early 1990s, also discussing the remaining problems. |
Keyword(in Japanese) | (See Japanese page) |
Keyword(in English) | III-V Compound Semiconductor / Nitride semiconductor / Semiconductor Laser / LED / Degradation / Dislocation / Point Defect / TEM / PL |
Paper # | R2012-26,EMD2012-32,CPM2012-57,OPE2012-64,LQE2012-30 |
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Conference Information | |
Committee | CPM |
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Conference Date | 2012/8/16(1days) |
Place (in Japanese) | (See Japanese page) |
Place (in English) | |
Topics (in Japanese) | (See Japanese page) |
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Paper Information | |
Registration To | Component Parts and Materials (CPM) |
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Language | JPN |
Title (in Japanese) | (See Japanese page) |
Sub Title (in Japanese) | (See Japanese page) |
Title (in English) | Study on Reliability of Semiconductor Optical Devices : General Remarks and Topics since the Early 1990s |
Sub Title (in English) | |
Keyword(1) | III-V Compound Semiconductor |
Keyword(2) | Nitride semiconductor |
Keyword(3) | Semiconductor Laser |
Keyword(4) | LED |
Keyword(5) | Degradation |
Keyword(6) | Dislocation |
Keyword(7) | Point Defect |
Keyword(8) | TEM |
Keyword(9) | PL |
1st Author's Name | Osamu UEDA |
1st Author's Affiliation | Graduate School of Engineering, Kanazawa Institute of Technology() |
Date | 2012-08-23 |
Paper # | R2012-26,EMD2012-32,CPM2012-57,OPE2012-64,LQE2012-30 |
Volume (vol) | vol.112 |
Number (no) | 182 |
Page | pp.pp.- |
#Pages | 6 |
Date of Issue |