Presentation 2012-07-26
Smart Power LSI Technology Development : High Performance and High Reliability BiC-DMOS Device Development
Kenichi HATASAKO, Tetsuya NITTA, Masami HANE, Shigeto MAEGAWA,
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Abstract(in English) This paper presents high performance and high reliability BiC-DMOS device development, which act as the driving force devices toward high efficiency and energy saving society. The development trend of mixed-signal LSI is presented. High performance device development by fine process technology and SOI technology is described. BEOL transistor is presented as high potential transistor, which use wide band-gap semiconductor InGaZnO (IGZO).
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Keyword(in English) Mixed-signal LSI / BiC-DMOS / SOI / InGaZnO
Paper # ICD2012-23
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Committee ICD
Conference Date 2012/7/19(1days)
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Registration To Integrated Circuits and Devices (ICD)
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) Smart Power LSI Technology Development : High Performance and High Reliability BiC-DMOS Device Development
Sub Title (in English)
Keyword(1) Mixed-signal LSI
Keyword(2) BiC-DMOS
Keyword(3) SOI
Keyword(4) InGaZnO
1st Author's Name Kenichi HATASAKO
1st Author's Affiliation Mixed Signal Device Tech. Dept. Renesas Electronics Corp.()
2nd Author's Name Tetsuya NITTA
2nd Author's Affiliation Mixed Signal Device Tech. Dept. Renesas Electronics Corp.
3rd Author's Name Masami HANE
3rd Author's Affiliation Advanced LSI Devices Research Renesas Electronics Corp.
4th Author's Name Shigeto MAEGAWA
4th Author's Affiliation Mixed Signal Device Tech. Dept. Renesas Electronics Corp.
Date 2012-07-26
Paper # ICD2012-23
Volume (vol) vol.112
Number (no) 159
Page pp.pp.-
#Pages 5
Date of Issue