Presentation 2012-07-26
BER Calculation Modeling for 10G-EPON Systems
Namiko Ikeda, Kazuhiko Terada, Hiroyuki Uzawa, Akihiko Miyazaki, Satoshi Shigematsu, Masami Urano, Tsugumichi Shibata,
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Abstract(in English) In 10G-EPON systems, the high speed access networks in the next generation, the upper limits of the bit error rate (BER) are defined at the physical sub-layer (PHY) service interface after decoding (FEC decode, descramble, and 64B/66B decode) by the IEEE802.3av standard. In this paper, we propose a new BER measurement method in the interface and a new BER calculation model for verifying the proposed method. The proposed method calculates the BER of all frames by counting the number of error bits in frames received at the OLT and by estimating the number of error bits in discarded frames using the rate of discarded frames in an upstream direction. The BER calculation model is composed of functions generating and transmitting frames to an ONU, encoding and decoding at the ONU and the OLT, and attenuating in a fiber between the ONU and the OLT. This model is verified using the frame error rate which can be obtained without any estimation. Using the model, we verified that the proposed method precisely calculates the BER over a wide range, including around 10^<-3>, which conventional methods cannot do, and the BER is measured using the evaluating board of the 10G-EPON system.
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Keyword(in English) 10G-EPON / Bit Error Rate / Modeling
Paper # MW2012-31,OPE2012-24,EST2012-13,MWP2012-12
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Committee EST
Conference Date 2012/7/19(1days)
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Paper Information
Registration To Electronic Simulation Technology (EST)
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) BER Calculation Modeling for 10G-EPON Systems
Sub Title (in English)
Keyword(1) 10G-EPON
Keyword(2) Bit Error Rate
Keyword(3) Modeling
1st Author's Name Namiko Ikeda
1st Author's Affiliation NTT Microsystem Integration Laboratories()
2nd Author's Name Kazuhiko Terada
2nd Author's Affiliation NTT Microsystem Integration Laboratories
3rd Author's Name Hiroyuki Uzawa
3rd Author's Affiliation NTT Microsystem Integration Laboratories
4th Author's Name Akihiko Miyazaki
4th Author's Affiliation NTT Microsystem Integration Laboratories
5th Author's Name Satoshi Shigematsu
5th Author's Affiliation NTT Microsystem Integration Laboratories
6th Author's Name Masami Urano
6th Author's Affiliation NTT Microsystem Integration Laboratories
7th Author's Name Tsugumichi Shibata
7th Author's Affiliation NTT Microsystem Integration Laboratories
Date 2012-07-26
Paper # MW2012-31,OPE2012-24,EST2012-13,MWP2012-12
Volume (vol) vol.112
Number (no) 157
Page pp.pp.-
#Pages 6
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