Presentation 2012-07-02
A Quantitative Approach of Soft Error Rate Estimation by Monte-Carlo Simulation
Ken Yano, Takanori Hayashida, Toshinori Sato,
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Abstract(in English) In this paper a quantitative approach of SER(Soft Error Rate) of soft error rate estimation is proposed by Monte Carlo simulation by adopting a virtual particle irradiation model with in consideration of CMOS process variation. The proposed method is evaluated on normal Latch and SRAM and soft error tolerant Latch and SRAM. Although the soft error tolerant latch and SRAM introduced have sufficient tolerance about the soft error occurring at single node, they become vulnerable about the soft error which occurs in two or more different nodes during very short period of time. These characteristics are successfully evaluated by using proposed simulation method.
Keyword(in Japanese) (See Japanese page)
Keyword(in English) Soft Error / Single Event Upset / Monte-Carlo simulation / SER-Tolerant
Paper # CAS2012-11,VLD2012-21,SIP2012-43,MSS2012-11
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Conference Date 2012/6/25(1days)
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Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) A Quantitative Approach of Soft Error Rate Estimation by Monte-Carlo Simulation
Sub Title (in English)
Keyword(1) Soft Error
Keyword(2) Single Event Upset
Keyword(3) Monte-Carlo simulation
Keyword(4) SER-Tolerant
1st Author's Name Ken Yano
1st Author's Affiliation Fukuoka University:Japan Science and Technology Agency()
2nd Author's Name Takanori Hayashida
2nd Author's Affiliation Fukuoka University
3rd Author's Name Toshinori Sato
3rd Author's Affiliation Fukuoka University:Japan Science and Technology Agency
Date 2012-07-02
Paper # CAS2012-11,VLD2012-21,SIP2012-43,MSS2012-11
Volume (vol) vol.112
Number (no) 116
Page pp.pp.-
#Pages 6
Date of Issue