| Presentation | 2012-07-30 Influence of voltage ripples superimposed on the floating charge voltages of UPSs on VRLA battery Tomonobu TSUJIKAWA, Kahou YABUTA, |
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| Abstract(in Japanese) | (See Japanese page) |
| Abstract(in English) | In this paper, the influence on VRLA lifetime when a ripple is superimposed on a floating charge voltage is described. The VRLA battery is widely used as a backup power supply for the uninterruptible power supply (UPS). In addition, the VRLA battery is always floating charged by a constant voltage in preparation for power failures. However, a ripple is actually superimposed on the floating charge voltage of the UPS. The influence of superimposed ripples on VRLA battery was investigated for the case in which the charging voltage fluctuates like this. As a result, a significant difference could not be determined by the amount of positive grid corrosion and the state of the strap corrosion. From these results, it is clear that the ripples superimposed on the floating charge voltages of UPSs do not influence battery. |
| Keyword(in Japanese) | (See Japanese page) |
| Keyword(in English) | VRLA battery / UPS / Ripple / Corrosion |
| Paper # | EE2012-5 |
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| Conference Information | |
| Committee | EE |
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| Conference Date | 2012/7/23(1days) |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | |
| Topics (in Japanese) | (See Japanese page) |
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| Paper Information | |
| Registration To | Energy Engineering in Electronics and Communications (EE) |
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| Language | JPN |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | Influence of voltage ripples superimposed on the floating charge voltages of UPSs on VRLA battery |
| Sub Title (in English) | |
| Keyword(1) | VRLA battery |
| Keyword(2) | UPS |
| Keyword(3) | Ripple |
| Keyword(4) | Corrosion |
| 1st Author's Name | Tomonobu TSUJIKAWA |
| 1st Author's Affiliation | R&D Headquarters, NTT Facilities, Inc.() |
| 2nd Author's Name | Kahou YABUTA |
| 2nd Author's Affiliation | R&D Headquarters, NTT Facilities, Inc. |
| Date | 2012-07-30 |
| Paper # | EE2012-5 |
| Volume (vol) | vol.112 |
| Number (no) | 167 |
| Page | pp.pp.- |
| #Pages | 4 |
| Date of Issue | |