| Presentation | 2012-06-22 Evaluation of the on-chip temperature and voltage using ring-oscillator-based monitoring circuit and a study for an application to field test Yousuke MIYAKE, Takuma SASAKAWA, Yasuo SATO, Seiji KAJIHARA, Yukiya MIURA, |
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| Abstract(in Japanese) | (See Japanese page) |
| Abstract(in English) | Delay increase due to aging phenomena is a critical issue of VLSIs. For detecting such increase in field, highly accurate delay measurement that considers the influence by temperature and voltage is strongly needed. Therefore, we developed a TEG, in which ring-oscillator-based monitoring circuits are embedded, and evaluated on-chip temperature and voltage using the monitor circuits. In this paper, we discuss the issues and solutions field for test by using the evaluation results of the chip. |
| Keyword(in Japanese) | (See Japanese page) |
| Keyword(in English) | Aging / Field test / Temperature and Voltage monitor / Ring Oscillator |
| Paper # | DC2012-16 |
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| Committee | DC |
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| Conference Date | 2012/6/15(1days) |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | |
| Topics (in Japanese) | (See Japanese page) |
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| Registration To | Dependable Computing (DC) |
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| Language | JPN |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | Evaluation of the on-chip temperature and voltage using ring-oscillator-based monitoring circuit and a study for an application to field test |
| Sub Title (in English) | |
| Keyword(1) | Aging |
| Keyword(2) | Field test |
| Keyword(3) | Temperature and Voltage monitor |
| Keyword(4) | Ring Oscillator |
| 1st Author's Name | Yousuke MIYAKE |
| 1st Author's Affiliation | Kyushu Institute of Technology:JST, CREST() |
| 2nd Author's Name | Takuma SASAKAWA |
| 2nd Author's Affiliation | Kyushu Institute of Technology:JST, CREST |
| 3rd Author's Name | Yasuo SATO |
| 3rd Author's Affiliation | Kyushu Institute of Technology:JST, CREST |
| 4th Author's Name | Seiji KAJIHARA |
| 4th Author's Affiliation | Kyushu Institute of Technology:JST, CREST |
| 5th Author's Name | Yukiya MIURA |
| 5th Author's Affiliation | Tokyo Metropolitan University:JST, CREST |
| Date | 2012-06-22 |
| Paper # | DC2012-16 |
| Volume (vol) | vol.112 |
| Number (no) | 102 |
| Page | pp.pp.- |
| #Pages | 6 |
| Date of Issue | |