| Presentation | 2012-06-22 On Per-Cell Dynamic IR-Drop Estimation in At-Speed Scan Testing Yuta YAMATO, Tomokazu YONEDA, Kazumi HATAYAMA, Michiko INOUE, |
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| PDF Download Page |  PDF download Page Link |
| Abstract(in Japanese) | (See Japanese page) |
| Abstract(in English) | It is well known that dynamic IR-drop analysis consumes large amount of time even for a few clock cycles. This paper addresses this issue with a novel per-cell dynamic IR-drop estimation method. Instead of performing time-consuming IR-drop analysis for each clock cycle one by one, the proposed method uses global cycle average power profile for each cycle and dynamic IR-drop profiles for a few representative cycles, thus total computation time is effectively reduced. Experimental results on a benchmark circuit demonstrate that the proposed method achieves both high accuracy and high time-efficiency. |
| Keyword(in Japanese) | (See Japanese page) |
| Keyword(in English) | IR-drop / Scan testing / Test power / Test-induced yield loss |
| Paper # | DC2012-15 |
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| Conference Information | |
| Committee | DC |
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| Conference Date | 2012/6/15(1days) |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | |
| Topics (in Japanese) | (See Japanese page) |
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| Paper Information | |
| Registration To | Dependable Computing (DC) |
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| Language | ENG |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | On Per-Cell Dynamic IR-Drop Estimation in At-Speed Scan Testing |
| Sub Title (in English) | |
| Keyword(1) | IR-drop |
| Keyword(2) | Scan testing |
| Keyword(3) | Test power |
| Keyword(4) | Test-induced yield loss |
| 1st Author's Name | Yuta YAMATO |
| 1st Author's Affiliation | Nara Institute of Science and Technology:Japan Science and Technology Agency, CREST() |
| 2nd Author's Name | Tomokazu YONEDA |
| 2nd Author's Affiliation | Nara Institute of Science and Technology:Japan Science and Technology Agency, CREST |
| 3rd Author's Name | Kazumi HATAYAMA |
| 3rd Author's Affiliation | Nara Institute of Science and Technology:Japan Science and Technology Agency, CREST |
| 4th Author's Name | Michiko INOUE |
| 4th Author's Affiliation | Nara Institute of Science and Technology:Japan Science and Technology Agency, CREST |
| Date | 2012-06-22 |
| Paper # | DC2012-15 |
| Volume (vol) | vol.112 |
| Number (no) | 102 |
| Page | pp.pp.- |
| #Pages | 6 |
| Date of Issue | |