Presentation | 2012-06-22 An Evaluation of Low Power BIST Method Yasuo SATO, Senling WANG, Takaaki KATO, Kohei MIYASE, Seiji KAJIHARA, |
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Abstract(in Japanese) | (See Japanese page) |
Abstract(in English) | Low-power test technology has been investigated deeply to achieve an accurate and efficient testing. Although many sophisticated methods are proposed for scan-test, there are not so many for logic BIST because of its uncontrollable randomness. However, logic BIST currently becomes vital for system debug or field test. This paper proposes a novel low power BIST technology that eliminates the specified high-frequency parts of vectors in scan-shift and also reduces capture power. The authors show that the proposed technology not only reduces test power but also controls test power with little loss of test coverage. |
Keyword(in Japanese) | (See Japanese page) |
Keyword(in English) | Logic BIST / Test power / Fault coverage |
Paper # | DC2012-14 |
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Committee | DC |
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Conference Date | 2012/6/15(1days) |
Place (in Japanese) | (See Japanese page) |
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Registration To | Dependable Computing (DC) |
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Language | JPN |
Title (in Japanese) | (See Japanese page) |
Sub Title (in Japanese) | (See Japanese page) |
Title (in English) | An Evaluation of Low Power BIST Method |
Sub Title (in English) | |
Keyword(1) | Logic BIST |
Keyword(2) | Test power |
Keyword(3) | Fault coverage |
1st Author's Name | Yasuo SATO |
1st Author's Affiliation | Kyushu Institute of Technology:Japan Science and Technology Agency, CREST() |
2nd Author's Name | Senling WANG |
2nd Author's Affiliation | Kyushu Institute of Technology:Japan Science and Technology Agency, CREST |
3rd Author's Name | Takaaki KATO |
3rd Author's Affiliation | Kyushu Institute of Technology:Japan Science and Technology Agency, CREST |
4th Author's Name | Kohei MIYASE |
4th Author's Affiliation | Kyushu Institute of Technology:Japan Science and Technology Agency, CREST |
5th Author's Name | Seiji KAJIHARA |
5th Author's Affiliation | Kyushu Institute of Technology:Japan Science and Technology Agency, CREST |
Date | 2012-06-22 |
Paper # | DC2012-14 |
Volume (vol) | vol.112 |
Number (no) | 102 |
Page | pp.pp.- |
#Pages | 6 |
Date of Issue |