Presentation 2012-06-22
Note on Layout-Aware High Accuracy Estimation of Bridge/Open Fault Coverage
Masayuki Arai, Yoshihiro Shimizu, Kazuhiko Iwasaki,
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Abstract(in English) Shrinking feature size and higher integration on semiconductor device manufacturing technology bring a problem of the gap between the defect level estimated at the design stage from the reported one for fabricated devices. In this study, as one possible strategy to accurately estimate the defect level, we discuss on fault coverage estimation with more accuracy for the given test pattern set. We consider the probability that intermediate voltage caused by bridge/open defects is translated into logic values 0/1 at any of successive nodes, For each possible wire and wire pair in a given layout data, we execute critical area analysis. On the basis of critical areas obtained, we calculate weighted bridge/open fault coverage, considering frequency of occurrence of each fault.
Keyword(in Japanese) (See Japanese page)
Keyword(in English) weighted fault coverage / weighted probabilistic fault coverage / layout-aware / critical area
Paper # DC2012-13
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Committee DC
Conference Date 2012/6/15(1days)
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Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) Note on Layout-Aware High Accuracy Estimation of Bridge/Open Fault Coverage
Sub Title (in English)
Keyword(1) weighted fault coverage
Keyword(2) weighted probabilistic fault coverage
Keyword(3) layout-aware
Keyword(4) critical area
1st Author's Name Masayuki Arai
1st Author's Affiliation Faculty of System Design, Tokyo Metropolitan University:Graduate School of System Design, Tokyo Metropolitan University()
2nd Author's Name Yoshihiro Shimizu
2nd Author's Affiliation Graduate School of System Design, Tokyo Metropolitan University
3rd Author's Name Kazuhiko Iwasaki
3rd Author's Affiliation Faculty of System Design, Tokyo Metropolitan University:Graduate School of System Design, Tokyo Metropolitan University
Date 2012-06-22
Paper # DC2012-13
Volume (vol) vol.112
Number (no) 102
Page pp.pp.-
#Pages 6
Date of Issue