Presentation 2012-06-22
Empirical study for signal integrity-defects
Hiroshi TAKAHASHI, Yoshinobu HIGAMI, Toshiyuki TSUTSUMI, Kouji YAMAZAKI, Hiroyuki YOTSUYANAGI, Masaki HASHIZUME,
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Abstract(in English) We try to empirically study signal integrity-defects. In this study, we analyze the resistive open fault that causes the signal integrity-defect by using the three-dimensional (3-D) electromagnetic software and the TEG with the resistive open faults. We propose a method for generating the test patterns for the resistive open faults under the launch-off-capture (LOC) test. We also propose a method for diagnosing the resistive open faults by using the diagnostic delay fault simulation with considering the affects of the adjacent lines.
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Keyword(in English) resistive open fault / test pattern generation / diagnosis / extended delay fault model / adjacent lines
Paper # DC2012-12
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Committee DC
Conference Date 2012/6/15(1days)
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Registration To Dependable Computing (DC)
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) Empirical study for signal integrity-defects
Sub Title (in English)
Keyword(1) resistive open fault
Keyword(2) test pattern generation
Keyword(3) diagnosis
Keyword(4) extended delay fault model
Keyword(5) adjacent lines
1st Author's Name Hiroshi TAKAHASHI
1st Author's Affiliation Graduate School of Science and Engineering, Ehime University()
2nd Author's Name Yoshinobu HIGAMI
2nd Author's Affiliation Graduate School of Science and Engineering, Ehime University
3rd Author's Name Toshiyuki TSUTSUMI
3rd Author's Affiliation Meiji University
4th Author's Name Kouji YAMAZAKI
4th Author's Affiliation Meiji University
5th Author's Name Hiroyuki YOTSUYANAGI
5th Author's Affiliation Graduate School of Advanced Technology and Science, the University of Tokushima
6th Author's Name Masaki HASHIZUME
6th Author's Affiliation Graduate School of Advanced Technology and Science, the University of Tokushima
Date 2012-06-22
Paper # DC2012-12
Volume (vol) vol.112
Number (no) 102
Page pp.pp.-
#Pages 6
Date of Issue