| Presentation | 2012-06-22 Empirical study for signal integrity-defects Hiroshi TAKAHASHI, Yoshinobu HIGAMI, Toshiyuki TSUTSUMI, Kouji YAMAZAKI, Hiroyuki YOTSUYANAGI, Masaki HASHIZUME, |
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| PDF Download Page |  PDF download Page Link |
| Abstract(in Japanese) | (See Japanese page) |
| Abstract(in English) | We try to empirically study signal integrity-defects. In this study, we analyze the resistive open fault that causes the signal integrity-defect by using the three-dimensional (3-D) electromagnetic software and the TEG with the resistive open faults. We propose a method for generating the test patterns for the resistive open faults under the launch-off-capture (LOC) test. We also propose a method for diagnosing the resistive open faults by using the diagnostic delay fault simulation with considering the affects of the adjacent lines. |
| Keyword(in Japanese) | (See Japanese page) |
| Keyword(in English) | resistive open fault / test pattern generation / diagnosis / extended delay fault model / adjacent lines |
| Paper # | DC2012-12 |
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| Committee | DC |
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| Conference Date | 2012/6/15(1days) |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | |
| Topics (in Japanese) | (See Japanese page) |
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| Paper Information | |
| Registration To | Dependable Computing (DC) |
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| Language | JPN |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | Empirical study for signal integrity-defects |
| Sub Title (in English) | |
| Keyword(1) | resistive open fault |
| Keyword(2) | test pattern generation |
| Keyword(3) | diagnosis |
| Keyword(4) | extended delay fault model |
| Keyword(5) | adjacent lines |
| 1st Author's Name | Hiroshi TAKAHASHI |
| 1st Author's Affiliation | Graduate School of Science and Engineering, Ehime University() |
| 2nd Author's Name | Yoshinobu HIGAMI |
| 2nd Author's Affiliation | Graduate School of Science and Engineering, Ehime University |
| 3rd Author's Name | Toshiyuki TSUTSUMI |
| 3rd Author's Affiliation | Meiji University |
| 4th Author's Name | Kouji YAMAZAKI |
| 4th Author's Affiliation | Meiji University |
| 5th Author's Name | Hiroyuki YOTSUYANAGI |
| 5th Author's Affiliation | Graduate School of Advanced Technology and Science, the University of Tokushima |
| 6th Author's Name | Masaki HASHIZUME |
| 6th Author's Affiliation | Graduate School of Advanced Technology and Science, the University of Tokushima |
| Date | 2012-06-22 |
| Paper # | DC2012-12 |
| Volume (vol) | vol.112 |
| Number (no) | 102 |
| Page | pp.pp.- |
| #Pages | 6 |
| Date of Issue | |