| Presentation | 2012-06-22 A Study on Fault Tolerant Test Pattern Generators for Reliable Built-in Self Test Yuki FUKAZAWA, Tsuyoshi IWAGAKI, Hideyuki ICHIHARA, Tomoo INOUE, |
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| PDF Download Page |  PDF download Page Link |
| Abstract(in Japanese) | (See Japanese page) |
| Abstract(in English) | In the BIST (built-in self-test) scheme, the occurrence of faults in BIST circuits, such as TPGs (test pattern generators) and test response analyzers, may cause unreliable testing of chips, so that it results in field defects and yield loss. If BIST circuits are fault-tolerant, faulty BIST circuits behave as fault-free ones. As a result, testing of chips becomes more reliable. In this paper, we propose two novel fault-tolerant TPGs for reliable BIST, and discuss the reliability of not only the two fault-tolerant TPGs but also the repairable TPG under the assumption where permanent or transient faults exist in the TPGs. Experimental results show that the proposed TPGs are effective under the assumption of permanent faults and transient faults, respectively. |
| Keyword(in Japanese) | (See Japanese page) |
| Keyword(in English) | Built-in self-test / fault tolerance / test pattern generators / reliable test / cyclic code / reliability model |
| Paper # | DC2012-11 |
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| Conference Information | |
| Committee | DC |
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| Conference Date | 2012/6/15(1days) |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | |
| Topics (in Japanese) | (See Japanese page) |
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| Paper Information | |
| Registration To | Dependable Computing (DC) |
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| Language | JPN |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | A Study on Fault Tolerant Test Pattern Generators for Reliable Built-in Self Test |
| Sub Title (in English) | |
| Keyword(1) | Built-in self-test |
| Keyword(2) | fault tolerance |
| Keyword(3) | test pattern generators |
| Keyword(4) | reliable test |
| Keyword(5) | cyclic code |
| Keyword(6) | reliability model |
| 1st Author's Name | Yuki FUKAZAWA |
| 1st Author's Affiliation | Graduate School of Information Sciences, Hiroshima City University() |
| 2nd Author's Name | Tsuyoshi IWAGAKI |
| 2nd Author's Affiliation | Graduate School of Information Sciences, Hiroshima City University |
| 3rd Author's Name | Hideyuki ICHIHARA |
| 3rd Author's Affiliation | Graduate School of Information Sciences, Hiroshima City University |
| 4th Author's Name | Tomoo INOUE |
| 4th Author's Affiliation | Graduate School of Information Sciences, Hiroshima City University |
| Date | 2012-06-22 |
| Paper # | DC2012-11 |
| Volume (vol) | vol.112 |
| Number (no) | 102 |
| Page | pp.pp.- |
| #Pages | 6 |
| Date of Issue | |