| Presentation | 2012-06-22 An evaluation of a don't care filling method to improve fault sensitization coverage Ryosuke WAKASUGI, Toshinori HOSOKAWA, Masayoshi YOSHIMURA, |
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| PDF Download Page |  PDF download Page Link |
| Abstract(in Japanese) | (See Japanese page) |
| Abstract(in English) | A single stuck-at fault model and a transition fault model have been widely used to generate test patterns for VLSIs. However, recently defects which are not detected by test sets for the classical fault models increase with the growing density and complexity of VLSIs. In this paper, fault sensitization coverage is defined as the simple measure of test quality for a small delay fault. Defects which frequently occur in VLSIs is modeled as a small delay fault and the detection conditions are complex. This paper proposes a don't care filling method to improve fault sensitization coverage for given initial transition fault test sets. This method is possible to generate high quality test sets for small delay without any impact on test data volume. Experimental results show that final test sets generated by the proposed don't care filling method improved SDQL by 0.2～7.0% compared with given initial transition fault sets. |
| Keyword(in Japanese) | (See Japanese page) |
| Keyword(in English) | transition faults / test quality / fault sensitization coverage / small delay faults / SDQL / don't care filling |
| Paper # | DC2012-9 |
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| Conference Information | |
| Committee | DC |
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| Conference Date | 2012/6/15(1days) |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | |
| Topics (in Japanese) | (See Japanese page) |
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| Paper Information | |
| Registration To | Dependable Computing (DC) |
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| Language | JPN |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | An evaluation of a don't care filling method to improve fault sensitization coverage |
| Sub Title (in English) | |
| Keyword(1) | transition faults |
| Keyword(2) | test quality |
| Keyword(3) | fault sensitization coverage |
| Keyword(4) | small delay faults |
| Keyword(5) | SDQL |
| Keyword(6) | don't care filling |
| 1st Author's Name | Ryosuke WAKASUGI |
| 1st Author's Affiliation | Graduate School of Industrial Technology, Nihon University() |
| 2nd Author's Name | Toshinori HOSOKAWA |
| 2nd Author's Affiliation | College of Industrial Technology, Nihon University |
| 3rd Author's Name | Masayoshi YOSHIMURA |
| 3rd Author's Affiliation | Graduate School of Information Science and Electrical Engineering, Kyushu University |
| Date | 2012-06-22 |
| Paper # | DC2012-9 |
| Volume (vol) | vol.112 |
| Number (no) | 102 |
| Page | pp.pp.- |
| #Pages | 6 |
| Date of Issue | |