Presentation | 2012-06-01 Nondestructive and Simultaneous Measurement of Complex EM Parameters with Scalar Reflectometer Chun-Ping Chen, Hiroki Takamori, Junya Oda, Tetsuo Anada, Zhewang Ma, |
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Abstract(in Japanese) | (See Japanese page) |
Abstract(in English) | A scalar reflectometer based, low cost method, named "multi-thickness method"(MTM), is proposed for non-destructively and simultaneously charactering the complex permittivity and permeability of high loss materials via an open-ended coaxial probe. The measurement system is established, while the sample-loaded open-ended coaxial probe is modeled by the spectral domain immitance(SDI) method. A discussion about how to select the multi thicknesses of test sample is also included based on the analysis and our experience. The broadband frequency-swept measurement has been conducted on a typical absorbing material under different thicknesses combination conditions. The experiment results agree well with the reference data, which validates the feasibility and effectiveness of this improved technique. |
Keyword(in Japanese) | (See Japanese page) |
Keyword(in English) | Multi-thickness method(MTM) / Scalar reflectometer / Complex permeability / Complex permittivity / Coaxial probe / Nondestructive measurement |
Paper # | EST2012-1 |
Date of Issue |
Conference Information | |
Committee | EST |
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Conference Date | 2012/5/25(1days) |
Place (in Japanese) | (See Japanese page) |
Place (in English) | |
Topics (in Japanese) | (See Japanese page) |
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Paper Information | |
Registration To | Electronic Simulation Technology (EST) |
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Language | JPN |
Title (in Japanese) | (See Japanese page) |
Sub Title (in Japanese) | (See Japanese page) |
Title (in English) | Nondestructive and Simultaneous Measurement of Complex EM Parameters with Scalar Reflectometer |
Sub Title (in English) | |
Keyword(1) | Multi-thickness method(MTM) |
Keyword(2) | Scalar reflectometer |
Keyword(3) | Complex permeability |
Keyword(4) | Complex permittivity |
Keyword(5) | Coaxial probe |
Keyword(6) | Nondestructive measurement |
1st Author's Name | Chun-Ping Chen |
1st Author's Affiliation | Electrical, Electronics and Information Engineering, Kanagawa University() |
2nd Author's Name | Hiroki Takamori |
2nd Author's Affiliation | Electrical, Electronics and Information Engineering, Kanagawa University |
3rd Author's Name | Junya Oda |
3rd Author's Affiliation | Electrical, Electronics and Information Engineering, Kanagawa University |
4th Author's Name | Tetsuo Anada |
4th Author's Affiliation | Electrical, Electronics and Information Engineering, Kanagawa University |
5th Author's Name | Zhewang Ma |
5th Author's Affiliation | Department of Electrical and Electronics Systems, Saitama University |
Date | 2012-06-01 |
Paper # | EST2012-1 |
Volume (vol) | vol.112 |
Number (no) | 74 |
Page | pp.pp.- |
#Pages | 6 |
Date of Issue |