Presentation 2012-06-01
Nondestructive and Simultaneous Measurement of Complex EM Parameters with Scalar Reflectometer
Chun-Ping Chen, Hiroki Takamori, Junya Oda, Tetsuo Anada, Zhewang Ma,
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Abstract(in English) A scalar reflectometer based, low cost method, named "multi-thickness method"(MTM), is proposed for non-destructively and simultaneously charactering the complex permittivity and permeability of high loss materials via an open-ended coaxial probe. The measurement system is established, while the sample-loaded open-ended coaxial probe is modeled by the spectral domain immitance(SDI) method. A discussion about how to select the multi thicknesses of test sample is also included based on the analysis and our experience. The broadband frequency-swept measurement has been conducted on a typical absorbing material under different thicknesses combination conditions. The experiment results agree well with the reference data, which validates the feasibility and effectiveness of this improved technique.
Keyword(in Japanese) (See Japanese page)
Keyword(in English) Multi-thickness method(MTM) / Scalar reflectometer / Complex permeability / Complex permittivity / Coaxial probe / Nondestructive measurement
Paper # EST2012-1
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Committee EST
Conference Date 2012/5/25(1days)
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Registration To Electronic Simulation Technology (EST)
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) Nondestructive and Simultaneous Measurement of Complex EM Parameters with Scalar Reflectometer
Sub Title (in English)
Keyword(1) Multi-thickness method(MTM)
Keyword(2) Scalar reflectometer
Keyword(3) Complex permeability
Keyword(4) Complex permittivity
Keyword(5) Coaxial probe
Keyword(6) Nondestructive measurement
1st Author's Name Chun-Ping Chen
1st Author's Affiliation Electrical, Electronics and Information Engineering, Kanagawa University()
2nd Author's Name Hiroki Takamori
2nd Author's Affiliation Electrical, Electronics and Information Engineering, Kanagawa University
3rd Author's Name Junya Oda
3rd Author's Affiliation Electrical, Electronics and Information Engineering, Kanagawa University
4th Author's Name Tetsuo Anada
4th Author's Affiliation Electrical, Electronics and Information Engineering, Kanagawa University
5th Author's Name Zhewang Ma
5th Author's Affiliation Department of Electrical and Electronics Systems, Saitama University
Date 2012-06-01
Paper # EST2012-1
Volume (vol) vol.112
Number (no) 74
Page pp.pp.-
#Pages 6
Date of Issue