| Presentation | 2012-06-15 Study on Prevention of Trouble by Structure Analysis of LSI : The efforts for the reliability improvement of the electronic components for power plant Kazuya MURAKAMI, Yuichi SUMIMOTO, |
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| PDF Download Page |  PDF download Page Link |
| Abstract(in Japanese) | (See Japanese page) |
| Abstract(in English) | Electronic components to be applied to industrial products, it is necessary to be highly reliable. However, since the high-functionality, high-performance and diverse electronic components, it took some time to test reliability. Procurement of electronic components, foreign products have increased. We need to evaluate in a short period of time. In this report, we introduce a case analysis on the structure of the LSI to improve the reliability of electronic components. |
| Keyword(in Japanese) | (See Japanese page) |
| Keyword(in English) | LSI / The reliability test / The structural analysis / The article of good quality analysis |
| Paper # | R2012-11 |
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| Conference Information | |
| Committee | R |
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| Conference Date | 2012/6/8(1days) |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | |
| Topics (in Japanese) | (See Japanese page) |
| Topics (in English) | |
| Chair | |
| Vice Chair | |
| Secretary | |
| Assistant | |
| Paper Information | |
| Registration To | Reliability(R) |
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| Language | JPN |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | Study on Prevention of Trouble by Structure Analysis of LSI : The efforts for the reliability improvement of the electronic components for power plant |
| Sub Title (in English) | |
| Keyword(1) | LSI |
| Keyword(2) | The reliability test |
| Keyword(3) | The structural analysis |
| Keyword(4) | The article of good quality analysis |
| 1st Author's Name | Kazuya MURAKAMI |
| 1st Author's Affiliation | Power and Industrial Systems R&D center, Toshiba Corporation() |
| 2nd Author's Name | Yuichi SUMIMOTO |
| 2nd Author's Affiliation | Power and Industrial Systems R&D center, Toshiba Corporation |
| Date | 2012-06-15 |
| Paper # | R2012-11 |
| Volume (vol) | vol.112 |
| Number (no) | 82 |
| Page | pp.pp.- |
| #Pages | 5 |
| Date of Issue | |