Presentation | 2012-06-22 Flashover Voltage Properties between Foil Conductors on Printed Wiring Board for ESD Surge by Xenon Lump Irradiation Kotaro TSUBOI, Sho IWAI, Shinya OHTSUKA, |
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Abstract(in Japanese) | (See Japanese page) |
Abstract(in English) | Flashover voltages (FOVs) between foil conductors on printed wiring board (PWB) by electrostatic discharge (ESD) have a dispersion even at the same condition test. This dispersion could be caused by probabilities of initial electron generation (statistical time lag) and/or discharge development (formative time lag). In order to understand the FOV properties and develop the electronic devices with high immunity for ESD, it is important to the improve the repeatability of FO test. In this paper, we investigated FOV properties between foil conductors on PWB by xenon (Xe) lump irradiation. As a result, it was found that σ decreased to step ΔV (= 0.1kV) and V_<50> also decreases by 20% by Xe lump irradiation. V50 agreed with the Paschen curve below the g = 1.0 mm, and trend of the Toepler's equation over g = 1.0 mm. |
Keyword(in Japanese) | (See Japanese page) |
Keyword(in English) | Electrostatic discharge / Printed wiring board / Flashover / Xenon lump |
Paper # | EMCJ2012-29 |
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Conference Information | |
Committee | EMCJ |
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Conference Date | 2012/6/15(1days) |
Place (in Japanese) | (See Japanese page) |
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Topics (in Japanese) | (See Japanese page) |
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Paper Information | |
Registration To | Electromagnetic Compatibility (EMCJ) |
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Language | JPN |
Title (in Japanese) | (See Japanese page) |
Sub Title (in Japanese) | (See Japanese page) |
Title (in English) | Flashover Voltage Properties between Foil Conductors on Printed Wiring Board for ESD Surge by Xenon Lump Irradiation |
Sub Title (in English) | |
Keyword(1) | Electrostatic discharge |
Keyword(2) | Printed wiring board |
Keyword(3) | Flashover |
Keyword(4) | Xenon lump |
1st Author's Name | Kotaro TSUBOI |
1st Author's Affiliation | Kyushu Institute of Technology() |
2nd Author's Name | Sho IWAI |
2nd Author's Affiliation | Kyushu Institute of Technology |
3rd Author's Name | Shinya OHTSUKA |
3rd Author's Affiliation | Kyushu Institute of Technology |
Date | 2012-06-22 |
Paper # | EMCJ2012-29 |
Volume (vol) | vol.112 |
Number (no) | 100 |
Page | pp.pp.- |
#Pages | 4 |
Date of Issue |