Presentation 2012-06-22
Flashover Voltage Properties between Foil Conductors on Printed Wiring Board for ESD Surge by Xenon Lump Irradiation
Kotaro TSUBOI, Sho IWAI, Shinya OHTSUKA,
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Abstract(in Japanese) (See Japanese page)
Abstract(in English) Flashover voltages (FOVs) between foil conductors on printed wiring board (PWB) by electrostatic discharge (ESD) have a dispersion even at the same condition test. This dispersion could be caused by probabilities of initial electron generation (statistical time lag) and/or discharge development (formative time lag). In order to understand the FOV properties and develop the electronic devices with high immunity for ESD, it is important to the improve the repeatability of FO test. In this paper, we investigated FOV properties between foil conductors on PWB by xenon (Xe) lump irradiation. As a result, it was found that σ decreased to step ΔV (= 0.1kV) and V_<50> also decreases by 20% by Xe lump irradiation. V50 agreed with the Paschen curve below the g = 1.0 mm, and trend of the Toepler's equation over g = 1.0 mm.
Keyword(in Japanese) (See Japanese page)
Keyword(in English) Electrostatic discharge / Printed wiring board / Flashover / Xenon lump
Paper # EMCJ2012-29
Date of Issue

Conference Information
Committee EMCJ
Conference Date 2012/6/15(1days)
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Paper Information
Registration To Electromagnetic Compatibility (EMCJ)
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) Flashover Voltage Properties between Foil Conductors on Printed Wiring Board for ESD Surge by Xenon Lump Irradiation
Sub Title (in English)
Keyword(1) Electrostatic discharge
Keyword(2) Printed wiring board
Keyword(3) Flashover
Keyword(4) Xenon lump
1st Author's Name Kotaro TSUBOI
1st Author's Affiliation Kyushu Institute of Technology()
2nd Author's Name Sho IWAI
2nd Author's Affiliation Kyushu Institute of Technology
3rd Author's Name Shinya OHTSUKA
3rd Author's Affiliation Kyushu Institute of Technology
Date 2012-06-22
Paper # EMCJ2012-29
Volume (vol) vol.112
Number (no) 100
Page pp.pp.-
#Pages 4
Date of Issue