Presentation 2012-05-18
Growth and characterization of strained Ge epitaxial layers on SiGe substrates
Takashi YAMAHA, Osamu NAKATSUKA, Kyoichi KINOSHITA, Shinichi YODA, Shigeaki ZAIMA,
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Abstract(in English) In order to improve on the performance of Si ULSI, biaxially strained Ge channel is expected to be a high mobility channel material. We demonstrate the fabrication of a biaxially compressive strained Ge heteroepitaxial layer on a Si_<1-x>Ge_x substrate. The strain value of the compressive strained Ge layer is estimated to be 1.3% with x-ray diffraction and micro Raman spectroscopy. The degree of strain relaxation for the Ge layer is also estimated to be 38%. We also prepared strained Ge layers on a Si_<1-x>Ge_x layer-on-insulator structure which is formed with solid-phase mixing method for comparison, and investigated the mosaicity and surface roughness of strained Ge layers.
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Keyword(in English) silicon germanium / germanium / strain
Paper # ED2012-32,CPM2012-16,SDM2012-34
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Committee SDM
Conference Date 2012/5/10(1days)
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Registration To Silicon Device and Materials (SDM)
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) Growth and characterization of strained Ge epitaxial layers on SiGe substrates
Sub Title (in English)
Keyword(1) silicon germanium
Keyword(2) germanium
Keyword(3) strain
1st Author's Name Takashi YAMAHA
1st Author's Affiliation Graduate School of Engineering, Nagoya University()
2nd Author's Name Osamu NAKATSUKA
2nd Author's Affiliation Graduate School of Engineering, Nagoya University
3rd Author's Name Kyoichi KINOSHITA
3rd Author's Affiliation Institute of Space and Astronautical Science
4th Author's Name Shinichi YODA
4th Author's Affiliation Institute of Space and Astronautical Science
5th Author's Name Shigeaki ZAIMA
5th Author's Affiliation Graduate School of Engineering, Nagoya University
Date 2012-05-18
Paper # ED2012-32,CPM2012-16,SDM2012-34
Volume (vol) vol.112
Number (no) 34
Page pp.pp.-
#Pages 5
Date of Issue