| Presentation | 2012-05-29 Degradation Phenomenon of Electrical Contacts using some Oscillating Mechanisms : Modeling about Fluctuation of Contact Resistance (2) Shin-ichi WADA, Keiji KOSHIDA, Hiroaki KUBOTA, Koichiro SAWA, |
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| Abstract(in Japanese) | (See Japanese page) |
| Abstract(in English) | Authors have developed some mechanisms which give real vibration to electrical contacts and studied the influences of a micro-oscillating on the contact resistance. Because it was necessary to deal with time-sequential data for analyzing the degradation phenomena of electrical contacts by the oscillating mechanisms, they tried to use non-linear data processing in addition to usually linear one. It is shown that smoothed time-sequential data is adapted to the logistic model and the data is adapted to a modified logistic model with a periodic element without smoothing very much. The data is fitted to the model by introducing a time-delay element to them. And it is shown that there are semi-stable limit cycles and bifurcation phenomenon in the time-sequential fluctuation using raw data themselves. It is suggested that there is non-linear phenomenon is caused by static friction and Coulomb's one when external force vibrates the system. It is, however, not yet clear what element is major and what element is minor though it was clear that there are some non-linear elements. |
| Keyword(in Japanese) | (See Japanese page) |
| Keyword(in English) | electrical contact / micro-oscillation / contact resistance / micro-sliding mechanism / relative displacement / time-sequential data / non-linear data / logistic curve / limit cycle / bifurcation |
| Paper # | NLP2012-35 |
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| Conference Information | |
| Committee | NLP |
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| Conference Date | 2012/5/21(1days) |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | |
| Topics (in Japanese) | (See Japanese page) |
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| Paper Information | |
| Registration To | Nonlinear Problems (NLP) |
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| Language | JPN |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | Degradation Phenomenon of Electrical Contacts using some Oscillating Mechanisms : Modeling about Fluctuation of Contact Resistance (2) |
| Sub Title (in English) | |
| Keyword(1) | electrical contact |
| Keyword(2) | micro-oscillation |
| Keyword(3) | contact resistance |
| Keyword(4) | micro-sliding mechanism |
| Keyword(5) | relative displacement |
| Keyword(6) | time-sequential data |
| Keyword(7) | non-linear data |
| Keyword(8) | logistic curve |
| Keyword(9) | limit cycle |
| Keyword(10) | bifurcation |
| 1st Author's Name | Shin-ichi WADA |
| 1st Author's Affiliation | TMC System Co. Ltd.() |
| 2nd Author's Name | Keiji KOSHIDA |
| 2nd Author's Affiliation | TMC System Co. Ltd. |
| 3rd Author's Name | Hiroaki KUBOTA |
| 3rd Author's Affiliation | TMC System Co. Ltd. |
| 4th Author's Name | Koichiro SAWA |
| 4th Author's Affiliation | Keio University:Nippon Institute of Technology |
| Date | 2012-05-29 |
| Paper # | NLP2012-35 |
| Volume (vol) | vol.112 |
| Number (no) | 69 |
| Page | pp.pp.- |
| #Pages | 6 |
| Date of Issue | |