Presentation | 2012/2/24 An Algorithm for Statistical Timing Analysis Considering Long-Term Degradation Shuji Tsukiyama, Massahiro Fukui, |
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Abstract(in Japanese) | (See Japanese page) |
Abstract(in English) | The long-term degradation due to negative bias temperature instability (NBTI), hot carrier induced degradation, and/or electro-migration, becomes a problem in circuit design using nanometer process technologies, since it causes a delay fault in the field. In order to resolve the problem, we must estimate delay variation due to the long-term degradation in the design stage, but we must eliminate over estimation of the variation, so as to make the timing design easy. If we can treat the variation as a statistical value and take it into the statistical timing analysis, we can reduce over margin. Moreover, if we treat delay variations due to the process variability and long-term degradation together, we may be able to select an appropriate set of paths for which field testing are conducted to detect delay faults. Thus, in this paper, we propose a method to treat delay variation as a statistical value, and an algorithm for statistical timing analysis using this statistical value. |
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Paper # | Vol.2012-SLDM-155 No.6,Vol.2012-EMB-24 No.6 |
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Committee | DC |
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Conference Date | 2012/2/24(1days) |
Place (in Japanese) | (See Japanese page) |
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Registration To | Dependable Computing (DC) |
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Language | JPN |
Title (in Japanese) | (See Japanese page) |
Sub Title (in Japanese) | (See Japanese page) |
Title (in English) | An Algorithm for Statistical Timing Analysis Considering Long-Term Degradation |
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1st Author's Name | Shuji Tsukiyama |
1st Author's Affiliation | Dept. of Electrical, Electronic, and Communication Eng., Faculty of Science and Engineering, Chuo University() |
2nd Author's Name | Massahiro Fukui |
2nd Author's Affiliation | Dept. of VLSI System Design, College of Science & Engineering, Ritsumeikan University |
Date | 2012/2/24 |
Paper # | Vol.2012-SLDM-155 No.6,Vol.2012-EMB-24 No.6 |
Volume (vol) | vol.111 |
Number (no) | 462 |
Page | pp.pp.- |
#Pages | 6 |
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