Presentation 2012/2/24
An Algorithm for Statistical Timing Analysis Considering Long-Term Degradation
Shuji Tsukiyama, Massahiro Fukui,
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Abstract(in English) The long-term degradation due to negative bias temperature instability (NBTI), hot carrier induced degradation, and/or electro-migration, becomes a problem in circuit design using nanometer process technologies, since it causes a delay fault in the field. In order to resolve the problem, we must estimate delay variation due to the long-term degradation in the design stage, but we must eliminate over estimation of the variation, so as to make the timing design easy. If we can treat the variation as a statistical value and take it into the statistical timing analysis, we can reduce over margin. Moreover, if we treat delay variations due to the process variability and long-term degradation together, we may be able to select an appropriate set of paths for which field testing are conducted to detect delay faults. Thus, in this paper, we propose a method to treat delay variation as a statistical value, and an algorithm for statistical timing analysis using this statistical value.
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Paper # Vol.2012-SLDM-155 No.6,Vol.2012-EMB-24 No.6
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Conference Date 2012/2/24(1days)
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Language JPN
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Title (in English) An Algorithm for Statistical Timing Analysis Considering Long-Term Degradation
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1st Author's Name Shuji Tsukiyama
1st Author's Affiliation Dept. of Electrical, Electronic, and Communication Eng., Faculty of Science and Engineering, Chuo University()
2nd Author's Name Massahiro Fukui
2nd Author's Affiliation Dept. of VLSI System Design, College of Science & Engineering, Ritsumeikan University
Date 2012/2/24
Paper # Vol.2012-SLDM-155 No.6,Vol.2012-EMB-24 No.6
Volume (vol) vol.111
Number (no) 462
Page pp.pp.-
#Pages 6
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