Presentation 2012-03-16
Research and Development of Measurement and Testing Technique for Line Impedance Stabilized Network / Artificial Mains Network (LISN/AMN) : Establishment of Reliable Measurement System
Ryoko KISHIKAWA, Masahiro HORIBE, Masaaki SHIDA,
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Abstract(in Japanese) (See Japanese page)
Abstract(in English) In recent years, demands of management and regulation for electromagnetic use are increasing due to the wide use of electromagnetic waves in the social society. So, the establishment of measurement traceability system based on ISO/IEC 17025 is strongly required for instruments in EMC testing. According to the CISPR 16-1-2 standard, traceable calibrations of impedance and insertion loss for line impedance stabilization network / artificial mains network (LISN/AMN) are required over 9 kHz, however the issue is that there were no national metrology standards and measurement techniques for LISN/AMN. NMIJ has developed the impedance standard in RF region and considered a new method for assessing compliance with CISPR 16-1-2. The uncertainty of the impedance standard is small enough to make measurement or testing impedance of LISN/AMN. And then, NMIJ can make original transfer devices which are necessary for the new method.
Keyword(in Japanese) (See Japanese page)
Keyword(in English) high-frequency impedance / metrological standard / traceability / vector network analyzer (VNA) / testing / line impedance stabilized network/artificial mains network (LISN/AMN)
Paper # EMCJ2011-139
Date of Issue

Conference Information
Committee EMCJ
Conference Date 2012/3/9(1days)
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Paper Information
Registration To Electromagnetic Compatibility (EMCJ)
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) Research and Development of Measurement and Testing Technique for Line Impedance Stabilized Network / Artificial Mains Network (LISN/AMN) : Establishment of Reliable Measurement System
Sub Title (in English)
Keyword(1) high-frequency impedance
Keyword(2) metrological standard
Keyword(3) traceability
Keyword(4) vector network analyzer (VNA)
Keyword(5) testing
Keyword(6) line impedance stabilized network/artificial mains network (LISN/AMN)
1st Author's Name Ryoko KISHIKAWA
1st Author's Affiliation National Institute of Advanced Industrial Science and Technology (AIST), National Metrology Institute of Japan (NMIJ)()
2nd Author's Name Masahiro HORIBE
2nd Author's Affiliation National Institute of Advanced Industrial Science and Technology (AIST), National Metrology Institute of Japan (NMIJ)
3rd Author's Name Masaaki SHIDA
3rd Author's Affiliation National Institute of Advanced Industrial Science and Technology (AIST), National Metrology Institute of Japan (NMIJ)
Date 2012-03-16
Paper # EMCJ2011-139
Volume (vol) vol.111
Number (no) 492
Page pp.pp.-
#Pages 6
Date of Issue