| Presentation | 2012-03-16 Evaluation of Electric Field Strength Computation in Boundary Region between Near and Far Fields Masaru Nakayama, Takehiko Kobayashi, |
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| Abstract(in Japanese) | (See Japanese page) |
| Abstract(in English) | An equation for calculating electric field strength has been widely used for electromagnetic applications. This equation has also been applied to the calibration of electric field probes, which has been specified in various standards, such as ISO/TR 10305-1, ISO/TR 10305-2 and IEEE Std. 1309. It is, however, valid only in the far field region. It is well known that the far field distance is given by λ/2π, where λ is the wavelength. This formula, however, gives a distance where the magnitudes of three terms - electrostatic, induction, and radiation fields - are equal. The lowest test frequency specified in ISO 11452-2 is 80 MHz (λ=3.75m) and the test distance is 1 m, which slightly exceeds λ/2π. The accuracy attained by the conventional equation deteriorates at this marginal distance. In this report, a new equation for calculating the electric field strength is proposed, embracing the effects of variations in space impedance. Numerical results yielded by the conventional and proposed equations were compared with the experimental data measured in a radio anechoic chamber. Substantial improvement in accuracy was achieved with the proposed equation. |
| Keyword(in Japanese) | (See Japanese page) |
| Keyword(in English) | Electric field strength / near field / far field / radiated immunity test / electric field probe / calibration |
| Paper # | EMCJ2011-136 |
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| Conference Information | |
| Committee | EMCJ |
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| Conference Date | 2012/3/9(1days) |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | |
| Topics (in Japanese) | (See Japanese page) |
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| Registration To | Electromagnetic Compatibility (EMCJ) |
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| Language | JPN |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | Evaluation of Electric Field Strength Computation in Boundary Region between Near and Far Fields |
| Sub Title (in English) | |
| Keyword(1) | Electric field strength |
| Keyword(2) | near field |
| Keyword(3) | far field |
| Keyword(4) | radiated immunity test |
| Keyword(5) | electric field probe |
| Keyword(6) | calibration |
| 1st Author's Name | Masaru Nakayama |
| 1st Author's Affiliation | Wireless Systems Laboratory, Tokyo Denki University:EMC Kashima Corporation() |
| 2nd Author's Name | Takehiko Kobayashi |
| 2nd Author's Affiliation | Wireless Systems Laboratory, Tokyo Denki University |
| Date | 2012-03-16 |
| Paper # | EMCJ2011-136 |
| Volume (vol) | vol.111 |
| Number (no) | 492 |
| Page | pp.pp.- |
| #Pages | 6 |
| Date of Issue | |