| Presentation | 2012-01-26 Storage capacity of the associative memory model with the zero-order synaptic decay Ryota MIYATA, Jun TSUZURUGI, Toru AONISHI, Koji KURATA, |
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| PDF Download Page |  PDF download Page Link |
| Abstract(in Japanese) | (See Japanese page) |
| Abstract(in English) | It has been reported that synaptogenesis, formation of synaptic connection, continues to take place in certain regions of the postnatal brain including the hippocampal regions. According to the previous neurophysiological experiment, synapses with smaller strength tend to be eliminated with higher probability. We investigate the effect of synaptogenesis on memories in the neural circuit, proposing the abstract neural network model, the Hopfield model with the zero-order synaptic decay. Using the numerical simulations, we demonstrate the possibility that synaptogenesis plays a role in maintaining recent memories embedded in the network while avoiding overloading. We also show the storage capacity of the zero-order decay model as a function of the decay rate a which corresponds to the number of replacement synapses. Furthermore, we extend the zero-order decay model to β-th-order, and investigate its characteristics by varying the order of the decay term, β. The results show that the characteristics of the β-th-order decay model are constant for a large order β. |
| Keyword(in Japanese) | (See Japanese page) |
| Keyword(in English) | synaptogenesis / zero-order synaptic decay / associative memory / Hopfield model / forgetting process / β-th-order synaptic decay / overloading / storage capacity |
| Paper # | NC2011-97 |
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| Committee | NC |
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| Conference Date | 2012/1/19(1days) |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | |
| Topics (in Japanese) | (See Japanese page) |
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| Registration To | Neurocomputing (NC) |
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| Language | JPN |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | Storage capacity of the associative memory model with the zero-order synaptic decay |
| Sub Title (in English) | |
| Keyword(1) | synaptogenesis |
| Keyword(2) | zero-order synaptic decay |
| Keyword(3) | associative memory |
| Keyword(4) | Hopfield model |
| Keyword(5) | forgetting process |
| Keyword(6) | β-th-order synaptic decay |
| Keyword(7) | overloading |
| Keyword(8) | storage capacity |
| 1st Author's Name | Ryota MIYATA |
| 1st Author's Affiliation | Interdisciplinary Graduate School of Science and Engineering, Tokyo Institute of Technology() |
| 2nd Author's Name | Jun TSUZURUGI |
| 2nd Author's Affiliation | Faculty of Engineering, Okayama University of Science |
| 3rd Author's Name | Toru AONISHI |
| 3rd Author's Affiliation | Interdisciplinary Graduate School of Science and Engineering, Tokyo Institute of Technology |
| 4th Author's Name | Koji KURATA |
| 4th Author's Affiliation | Faculty of Engineering, University of the Ryukyus |
| Date | 2012-01-26 |
| Paper # | NC2011-97 |
| Volume (vol) | vol.111 |
| Number (no) | 419 |
| Page | pp.pp.- |
| #Pages | 6 |
| Date of Issue | |