Presentation 2012-02-07
High-frequency characterization of InAs nanowire MISFETs
Tatsuro Watanabe, Yutaka Otsuhata, Takao Waho, Kai Blekker, Werner Prost, Franz-Josef Tegude,
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Paper # ED2011-146,SDM2011-163
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Conference Date 2012/1/31(1days)
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Language JPN
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Title (in English) High-frequency characterization of InAs nanowire MISFETs
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1st Author's Name Tatsuro Watanabe
1st Author's Affiliation Faculty of Science and Technology, Sophia University()
2nd Author's Name Yutaka Otsuhata
2nd Author's Affiliation Faculty of Science and Technology, Sophia University
3rd Author's Name Takao Waho
3rd Author's Affiliation Faculty of Science and Technology, Sophia University
4th Author's Name Kai Blekker
4th Author's Affiliation Solid-State Electronics Department, University of Duisburg-Essen
5th Author's Name Werner Prost
5th Author's Affiliation Solid-State Electronics Department, University of Duisburg-Essen
6th Author's Name Franz-Josef Tegude
6th Author's Affiliation Solid-State Electronics Department, University of Duisburg-Essen
Date 2012-02-07
Paper # ED2011-146,SDM2011-163
Volume (vol) vol.111
Number (no) 425
Page pp.pp.-
#Pages 5
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