Presentation | 2012-01-27 Crosstalk induced Intensity Fluctuations and Bit-Error Rate Degradation in Optical Networks Junichi SAITO, Hao ZHANG, Mayumi ABE, Yoshiaki YAMAGUCHI, Takayuki YOSHINO, |
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Abstract(in Japanese) | (See Japanese page) |
Abstract(in English) | In WDM-based optical networks, crosstalk degrades system performance considerably. We have studied the probability density function of crosstalk-induced intensity fluctuation in detail and calculated the exact curve for several cases in previous works. In this report, the impact on performance of OOK systems is discussed analytically and experimentally for the single and two crosstalk elements having uncorrelated phase fluctuation and laying at the same frequency as the signal. All measured bit-error rates are in agreement with the numerical curves. As a result, it is shown that the crosstalk consisting of two elements degrades the system performance much more severely. |
Keyword(in Japanese) | (See Japanese page) |
Keyword(in English) | crosstalk / probability density function / intensity fluctuation / bit-error rate |
Paper # | OCS2011-118 |
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Committee | OCS |
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Conference Date | 2012/1/19(1days) |
Place (in Japanese) | (See Japanese page) |
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Registration To | Optical Communication Systems (OCS) |
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Language | JPN |
Title (in Japanese) | (See Japanese page) |
Sub Title (in Japanese) | (See Japanese page) |
Title (in English) | Crosstalk induced Intensity Fluctuations and Bit-Error Rate Degradation in Optical Networks |
Sub Title (in English) | |
Keyword(1) | crosstalk |
Keyword(2) | probability density function |
Keyword(3) | intensity fluctuation |
Keyword(4) | bit-error rate |
1st Author's Name | Junichi SAITO |
1st Author's Affiliation | School of Engineering, Tokyo Denki University() |
2nd Author's Name | Hao ZHANG |
2nd Author's Affiliation | School of Engineering, Tokyo Denki University |
3rd Author's Name | Mayumi ABE |
3rd Author's Affiliation | School of Engineering, Tokyo Denki University |
4th Author's Name | Yoshiaki YAMAGUCHI |
4th Author's Affiliation | Nippon Institute of Technology |
5th Author's Name | Takayuki YOSHINO |
5th Author's Affiliation | School of Engineering, Tokyo Denki University |
Date | 2012-01-27 |
Paper # | OCS2011-118 |
Volume (vol) | vol.111 |
Number (no) | 411 |
Page | pp.pp.- |
#Pages | 6 |
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