Presentation 2012-01-26
Measurement of IC Package Inductance with Transmission Line Embedded in Package
Kengo IOKIBE, Ayumi TANIMICHI, Yoshitaka TOYOTA,
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Abstract(in English) It is of importance for designers to possess accurate inductances of IC packages in power integrity(PI) and electromagnetic compatibility designs. The authors had proposed a simple method to measure inductance of IC package that is mounted on a practical printed circuit board. They investigated the method in terms of accuracy here. In the proposed method, a transmission line is embedded in an IC package interested, and two port S parameters of a network composed of a targeted package structure, the transmission line, and the corresponding symmetric package structure is measured. The package inductance is calculated from the measured S parameters and properties of the transmission line obtained beforehand. The proposed method was applied to four test IC packages, and their inductances were measured. The measurement was demonstrated on a commercial electromagnetic simulator, HFSS. The package inductances were also obtained by analyzing the test package directly for comparison to the results of the proposed method. They agreed with the maximum error of 0.9 nH. To understand a cause of the error, the authors investigated effects of dummy-objects that were used to place measuring ports in the HFSS calculation. The dummy-object caused errors less than 0.06 nH, which means it seldom cause significant errors.
Keyword(in Japanese) (See Japanese page)
Keyword(in English) IC/LSI / Package / Self-Inductance / Power integrity / Electromagnetic compatibility / Power distribution network
Paper # PN2011-35,OPE2011-151,LQE2011-137,EST2011-85,MWP2011-53
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Committee EST
Conference Date 2012/1/19(1days)
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Paper Information
Registration To Electronic Simulation Technology (EST)
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) Measurement of IC Package Inductance with Transmission Line Embedded in Package
Sub Title (in English)
Keyword(1) IC/LSI
Keyword(2) Package
Keyword(3) Self-Inductance
Keyword(4) Power integrity
Keyword(5) Electromagnetic compatibility
Keyword(6) Power distribution network
1st Author's Name Kengo IOKIBE
1st Author's Affiliation Graduate School of Natural Science and Technology, Okayama University()
2nd Author's Name Ayumi TANIMICHI
2nd Author's Affiliation Graduate School of Natural Science and Technology, Okayama University
3rd Author's Name Yoshitaka TOYOTA
3rd Author's Affiliation Graduate School of Natural Science and Technology, Okayama University
Date 2012-01-26
Paper # PN2011-35,OPE2011-151,LQE2011-137,EST2011-85,MWP2011-53
Volume (vol) vol.111
Number (no) 415
Page pp.pp.-
#Pages 6
Date of Issue