| Presentation | 2011-12-16 High Speed and Reliability Study of 1060nm VCSEL Toshihito Suzuki, Suguru Imai, Shinichi Kamiya, Koji Hiraiwa, Masaki Funabashi, Yasumasa Kawakita, Tomofumi Kise, Teruyuki Nakamura, Hitoshi Shimizu, Akihiko Kasukawa, |
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| PDF Download Page |  PDF download Page Link |
| Abstract(in Japanese) | (See Japanese page) |
| Abstract(in English) | Thanks to the double-intra-cavity structure and InGaAs/GaAs strained QWs, our VCSELs achieved low power consumption, high speed operation and high reliability at the same time, which are essential for light sources of optical interconnect. Dissipation power per bit rate is 0.14 mW/Gbps (140 fJ/bit) in 10 Gbps operation. With the long term aging test, we estimated random failure rate as low as 30 FIT/ch and wear-out lifetime as long as 300 years. As for long term stability of modulation properties, we propose that degradation of threshold current during aging test is an appropriate barometer rather than that of output power. In this point of view, our VCSELs showed good properties. For higher speed operation, we experimentally evaluated the relationship between oxidation layer thickness and reliability, and we confirmed feasibility of higher speed VCSELs keeping high reliability. |
| Keyword(in Japanese) | (See Japanese page) |
| Keyword(in English) | VCSEL / Optical Interconnect / Reliability / Low Power Consumption |
| Paper # | LQE2011-125 |
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| Conference Information | |
| Committee | LQE |
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| Conference Date | 2011/12/9(1days) |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | |
| Topics (in Japanese) | (See Japanese page) |
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| Vice Chair | |
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| Paper Information | |
| Registration To | Lasers and Quantum Electronics (LQE) |
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| Language | JPN |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | High Speed and Reliability Study of 1060nm VCSEL |
| Sub Title (in English) | |
| Keyword(1) | VCSEL |
| Keyword(2) | Optical Interconnect |
| Keyword(3) | Reliability |
| Keyword(4) | Low Power Consumption |
| 1st Author's Name | Toshihito Suzuki |
| 1st Author's Affiliation | Photonics Device Research Center, Furukawa Electric Co., Ltd.() |
| 2nd Author's Name | Suguru Imai |
| 2nd Author's Affiliation | Photonics Device Research Center, Furukawa Electric Co., Ltd. |
| 3rd Author's Name | Shinichi Kamiya |
| 3rd Author's Affiliation | Reliability First Group, Furukawa Electric Co., Ltd. |
| 4th Author's Name | Koji Hiraiwa |
| 4th Author's Affiliation | Photonics Device Research Center, Furukawa Electric Co., Ltd. |
| 5th Author's Name | Masaki Funabashi |
| 5th Author's Affiliation | Photonics Device Research Center, Furukawa Electric Co., Ltd. |
| 6th Author's Name | Yasumasa Kawakita |
| 6th Author's Affiliation | Photonics Device Research Center, Furukawa Electric Co., Ltd. |
| 7th Author's Name | Tomofumi Kise |
| 7th Author's Affiliation | Photonics Device Research Center, Furukawa Electric Co., Ltd. |
| 8th Author's Name | Teruyuki Nakamura |
| 8th Author's Affiliation | Photonics Device Research Center, Furukawa Electric Co., Ltd. |
| 9th Author's Name | Hitoshi Shimizu |
| 9th Author's Affiliation | Photonics Device Research Center, Furukawa Electric Co., Ltd. |
| 10th Author's Name | Akihiko Kasukawa |
| 10th Author's Affiliation | Photonics Device Research Center, Furukawa Electric Co., Ltd. |
| Date | 2011-12-16 |
| Paper # | LQE2011-125 |
| Volume (vol) | vol.111 |
| Number (no) | 359 |
| Page | pp.pp.- |
| #Pages | 5 |
| Date of Issue | |