Presentation 2011/12/8
Measurement on Dielectric Properties of FR-4 Substrate at Millimeter-wave Frequencies
Shingo INOUE, Futoshi KUROKI,
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Abstract(in English) Since the FR-4 substrate features high-mechanical strength, good insulation, and flame retardant property, it is widely used in printed circuits. The dielectric properties however have not been investigated at millimeter-wave regions because the loss performance degrades increasing operational frequencies. With this in mind, we investigated the complex permittivity based on the resonant method at millimeter-wave frequencies in this paper. Next, we calculated the eigen values using a commercially available simulation software, and then the complex permittivities were estimated at 30GHz and 60GHz. Finally, we compared the estimated permittivities with those presented by other publications.
Keyword(in Japanese) (See Japanese page)
Keyword(in English) FR-4 / Dielectric loss tangent / Relative permittivity / Resonance method / Microwaves / Millimeter-waves
Paper # MW2001-126
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Committee MW
Conference Date 2011/12/8(1days)
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Registration To Microwaves (MW)
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) Measurement on Dielectric Properties of FR-4 Substrate at Millimeter-wave Frequencies
Sub Title (in English)
Keyword(1) FR-4
Keyword(2) Dielectric loss tangent
Keyword(3) Relative permittivity
Keyword(4) Resonance method
Keyword(5) Microwaves
Keyword(6) Millimeter-waves
1st Author's Name Shingo INOUE
1st Author's Affiliation Kure national college of technology()
2nd Author's Name Futoshi KUROKI
2nd Author's Affiliation Kure national college of technology
Date 2011/12/8
Paper # MW2001-126
Volume (vol) vol.111
Number (no) 351
Page pp.pp.-
#Pages 4
Date of Issue