Presentation 2011-12-16
Trend on standardization of dependability : Outline of IEC TC56 and agenda on international meeting
Fumiaki HARADA, Hiroyuki GOTO, Hiroki TAKAMURA, Yoshiki KINOSHITA, Makoto TAKEYAMA,
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Abstract(in Japanese) (See Japanese page)
Abstract(in English) IEC/TC56 (International Electrotechnical Commission/Technical Committee 56) dependability meeting was held in Sydney, Australia from 7^ to 11^ November, 2011. The delegations of 11 counties including 5 Japanese representatives participated. This report is focused on the recent standardization and the technical trend through the discussion of the meeting.
Keyword(in Japanese) (See Japanese page)
Keyword(in English) IECTC56 / Dependability / Reliability / Safety
Paper # R2011-37
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Conference Information
Committee R
Conference Date 2011/12/9(1days)
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Paper Information
Registration To Reliability(R)
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) Trend on standardization of dependability : Outline of IEC TC56 and agenda on international meeting
Sub Title (in English)
Keyword(1) IECTC56
Keyword(2) Dependability
Keyword(3) Reliability
Keyword(4) Safety
1st Author's Name Fumiaki HARADA
1st Author's Affiliation Fuji Xerox Advanced Technology()
2nd Author's Name Hiroyuki GOTO
2nd Author's Affiliation FUJITSU Limited
3rd Author's Name Hiroki TAKAMURA
3rd Author's Affiliation Japan Science and Technology Japan
4th Author's Name Yoshiki KINOSHITA
4th Author's Affiliation Advanced Industrial Science and Technology
5th Author's Name Makoto TAKEYAMA
5th Author's Affiliation Advanced Industrial Science and Technology
Date 2011-12-16
Paper # R2011-37
Volume (vol) vol.111
Number (no) 354
Page pp.pp.-
#Pages 7
Date of Issue