Presentation 2011-12-09
A Study on Coupled Analysis based on FDTD and Circuit Simulators for Electromagnetic Fields Caused by Air Discharge
Kazuhiro FUJITA,
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Abstract(in English) For recent development of electronic devises and systems, there are an increased need for understanding dynamics of electrostatic discharge (BSD) noise with numerical simulations at early design stage. In this work, we propose a time domain coupled analysis based on FDTD-based full-wave simulator and SPICE-like circuit simulator in order to simulate electromagnetic fields excited by air discharge. Unlike existing methods, our approach calculates synchronously the electromagnetic field induced in analytical structures and the discharge currents on spark channels with both simulators in time domain. The electromagnetic fields are computed with the FDTD simulators, while the behavior of spark channel is expressed by an equivalent circuit based on a spark resistance formula and the discharge current is computed with the circuit simulator. In order to verify the proposed method, we apply it for several canonical models of air discharge between metals. In numerical examples, we show that results with our method are consistent with those with an existing approach and measurement data.
Keyword(in Japanese) (See Japanese page)
Keyword(in English) Air Discharge / FDTD Method / Circuit Simulator / Coupled Analysis / Electrostatic Discharge
Paper # EMCJ2011-100
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Conference Information
Committee EMCJ
Conference Date 2011/12/2(1days)
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Paper Information
Registration To Electromagnetic Compatibility (EMCJ)
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) A Study on Coupled Analysis based on FDTD and Circuit Simulators for Electromagnetic Fields Caused by Air Discharge
Sub Title (in English)
Keyword(1) Air Discharge
Keyword(2) FDTD Method
Keyword(3) Circuit Simulator
Keyword(4) Coupled Analysis
Keyword(5) Electrostatic Discharge
1st Author's Name Kazuhiro FUJITA
1st Author's Affiliation Fujitsu Limited()
Date 2011-12-09
Paper # EMCJ2011-100
Volume (vol) vol.111
Number (no) 335
Page pp.pp.-
#Pages 6
Date of Issue