Presentation 2011-11-17
Ultraviolet Photodetectors using Transparent Gate AlGaN/GaN HEMT
Tomotaka NARITA, Akio WAKEJIMA, Takashi EGAWA,
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Abstract(in English) Transparent gate AlGaN/GaN HEMT(High Electron Mobility Transistor) on a Si substrate was fabricated. We estimated as characteristics of DC and UV detectors by UV and visible light irradiation from the surface side. A significant drain current increase and a negative threshold-voltage shift occurred by UV light irradiation. Thus photogenerated carriers under transparent gate electrode were observed. The gate electrode enabled the device to operate under pinch-off conditions, resulted in low dark current. A high responsivity of 3×10^5A/W at 200μW/cm2 under a wavelength of 360nm was obtained.
Keyword(in Japanese) (See Japanese page)
Keyword(in English) GaN / AlGaN / HEMT / UV photodetectors
Paper # ED2011-86,CPM2011-135,LQE2011-109
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Committee CPM
Conference Date 2011/11/10(1days)
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Registration To Component Parts and Materials (CPM)
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) Ultraviolet Photodetectors using Transparent Gate AlGaN/GaN HEMT
Sub Title (in English)
Keyword(1) GaN
Keyword(2) AlGaN
Keyword(3) HEMT
Keyword(4) UV photodetectors
1st Author's Name Tomotaka NARITA
1st Author's Affiliation Research Center for Nano-Device and System, Nagoya Institute of Technology()
2nd Author's Name Akio WAKEJIMA
2nd Author's Affiliation Research Center for Nano-Device and System, Nagoya Institute of Technology
3rd Author's Name Takashi EGAWA
3rd Author's Affiliation Research Center for Nano-Device and System, Nagoya Institute of Technology
Date 2011-11-17
Paper # ED2011-86,CPM2011-135,LQE2011-109
Volume (vol) vol.111
Number (no) 291
Page pp.pp.-
#Pages 4
Date of Issue