Presentation | 2011-11-17 Ultraviolet Photodetectors using Transparent Gate AlGaN/GaN HEMT Tomotaka NARITA, Akio WAKEJIMA, Takashi EGAWA, |
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Abstract(in Japanese) | (See Japanese page) |
Abstract(in English) | Transparent gate AlGaN/GaN HEMT(High Electron Mobility Transistor) on a Si substrate was fabricated. We estimated as characteristics of DC and UV detectors by UV and visible light irradiation from the surface side. A significant drain current increase and a negative threshold-voltage shift occurred by UV light irradiation. Thus photogenerated carriers under transparent gate electrode were observed. The gate electrode enabled the device to operate under pinch-off conditions, resulted in low dark current. A high responsivity of 3×10^5A/W at 200μW/cm2 under a wavelength of 360nm was obtained. |
Keyword(in Japanese) | (See Japanese page) |
Keyword(in English) | GaN / AlGaN / HEMT / UV photodetectors |
Paper # | ED2011-86,CPM2011-135,LQE2011-109 |
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Conference Information | |
Committee | CPM |
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Conference Date | 2011/11/10(1days) |
Place (in Japanese) | (See Japanese page) |
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Paper Information | |
Registration To | Component Parts and Materials (CPM) |
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Language | JPN |
Title (in Japanese) | (See Japanese page) |
Sub Title (in Japanese) | (See Japanese page) |
Title (in English) | Ultraviolet Photodetectors using Transparent Gate AlGaN/GaN HEMT |
Sub Title (in English) | |
Keyword(1) | GaN |
Keyword(2) | AlGaN |
Keyword(3) | HEMT |
Keyword(4) | UV photodetectors |
1st Author's Name | Tomotaka NARITA |
1st Author's Affiliation | Research Center for Nano-Device and System, Nagoya Institute of Technology() |
2nd Author's Name | Akio WAKEJIMA |
2nd Author's Affiliation | Research Center for Nano-Device and System, Nagoya Institute of Technology |
3rd Author's Name | Takashi EGAWA |
3rd Author's Affiliation | Research Center for Nano-Device and System, Nagoya Institute of Technology |
Date | 2011-11-17 |
Paper # | ED2011-86,CPM2011-135,LQE2011-109 |
Volume (vol) | vol.111 |
Number (no) | 291 |
Page | pp.pp.- |
#Pages | 4 |
Date of Issue |