Presentation | 2011-11-28 Degradation of Oscillation Frequency of Ring Oscillators Placed on a 90 nm FPGA Shouhei ISHII, Kazutoshi KOBAYASHI, |
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Abstract(in Japanese) | (See Japanese page) |
Abstract(in English) | We focuse on issues related to degradation of FPGAs which has become dominant due to scaling and quantitatively estimate the degradation of FPGAs by NBTI. We map ring oscillators on the Cyclone II FPGAs and measure the variation of oscillation frequency. In the result, the variation of oscillation frequency is 5.97%. As for degradation of FPGAs, we measure the variation of oscillation frequency until 10,000 seconds passed at room temperature (28 degrees), 80 degrees or 100 degrees. As the result, degradation of oscillation frequency increases as temperature became higher and degradation of about 0.1% at 10,000 seconds was observed at high temperature. |
Keyword(in Japanese) | (See Japanese page) |
Keyword(in English) | NBTI / FPGA / Variation / Degradation |
Paper # | VLD2011-55,DC2011-31 |
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Committee | DC |
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Conference Date | 2011/11/21(1days) |
Place (in Japanese) | (See Japanese page) |
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Topics (in Japanese) | (See Japanese page) |
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Paper Information | |
Registration To | Dependable Computing (DC) |
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Language | JPN |
Title (in Japanese) | (See Japanese page) |
Sub Title (in Japanese) | (See Japanese page) |
Title (in English) | Degradation of Oscillation Frequency of Ring Oscillators Placed on a 90 nm FPGA |
Sub Title (in English) | |
Keyword(1) | NBTI |
Keyword(2) | FPGA |
Keyword(3) | Variation |
Keyword(4) | Degradation |
1st Author's Name | Shouhei ISHII |
1st Author's Affiliation | Graduate School of Science & Technology, Kyoto Institute of Technology() |
2nd Author's Name | Kazutoshi KOBAYASHI |
2nd Author's Affiliation | Graduate School of Science & Technology, Kyoto Institute of Technology:JST, CREST |
Date | 2011-11-28 |
Paper # | VLD2011-55,DC2011-31 |
Volume (vol) | vol.111 |
Number (no) | 325 |
Page | pp.pp.- |
#Pages | 6 |
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