Presentation 2011-11-28
Degradation of Oscillation Frequency of Ring Oscillators Placed on a 90 nm FPGA
Shouhei ISHII, Kazutoshi KOBAYASHI,
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Abstract(in English) We focuse on issues related to degradation of FPGAs which has become dominant due to scaling and quantitatively estimate the degradation of FPGAs by NBTI. We map ring oscillators on the Cyclone II FPGAs and measure the variation of oscillation frequency. In the result, the variation of oscillation frequency is 5.97%. As for degradation of FPGAs, we measure the variation of oscillation frequency until 10,000 seconds passed at room temperature (28 degrees), 80 degrees or 100 degrees. As the result, degradation of oscillation frequency increases as temperature became higher and degradation of about 0.1% at 10,000 seconds was observed at high temperature.
Keyword(in Japanese) (See Japanese page)
Keyword(in English) NBTI / FPGA / Variation / Degradation
Paper # VLD2011-55,DC2011-31
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Committee DC
Conference Date 2011/11/21(1days)
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Registration To Dependable Computing (DC)
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) Degradation of Oscillation Frequency of Ring Oscillators Placed on a 90 nm FPGA
Sub Title (in English)
Keyword(1) NBTI
Keyword(2) FPGA
Keyword(3) Variation
Keyword(4) Degradation
1st Author's Name Shouhei ISHII
1st Author's Affiliation Graduate School of Science & Technology, Kyoto Institute of Technology()
2nd Author's Name Kazutoshi KOBAYASHI
2nd Author's Affiliation Graduate School of Science & Technology, Kyoto Institute of Technology:JST, CREST
Date 2011-11-28
Paper # VLD2011-55,DC2011-31
Volume (vol) vol.111
Number (no) 325
Page pp.pp.-
#Pages 6
Date of Issue