Presentation | 2011-11-28 Scan-based Attack against Triple DES Cryptosystems Using Scan Signatures Hirokazu KODERA, Masao YANAGISAWA, Nozomu TOGAWA, |
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Abstract(in Japanese) | (See Japanese page) |
Abstract(in English) | Scan-path test is one of the useful design-for-test techniques, which can observe and control registers inside LSIs. On the other hand, a scan-based attack which retrieves secret keys from scanned data is considered to be one of the strongest side-channel attacks. In this paper, a scan-based attack method against Triple DES cryptosystems using a "scan signature" is proposed. In our method, several plaintexts are inputted into a Triple DES module and an attacker obtains scanned data. Then, an attacker observes a specific bit line (scan signature) of these scanned data to retrieve a secret key. The Triple DES algorithm uses three secret keys. The first secret key can be retrieved as in the same way as we can retrieve a secret key from a DES module. How to retrieve the second and third secret keys is the most concern. In our proposed method, we retrieve the second and third secret keys by using the retrieved first key and setting an appropriate scan signature. Experimental results show that our proposed method successfully retrieve three secret keys in a Triple DES module using up to 43 plaintexts. |
Keyword(in Japanese) | (See Japanese page) |
Keyword(in English) | triple data encryption standard / side-channel attacks / scan chain / scan-based attack |
Paper # | VLD2011-53,DC2011-29 |
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Conference Information | |
Committee | DC |
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Conference Date | 2011/11/21(1days) |
Place (in Japanese) | (See Japanese page) |
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Topics (in Japanese) | (See Japanese page) |
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Paper Information | |
Registration To | Dependable Computing (DC) |
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Language | JPN |
Title (in Japanese) | (See Japanese page) |
Sub Title (in Japanese) | (See Japanese page) |
Title (in English) | Scan-based Attack against Triple DES Cryptosystems Using Scan Signatures |
Sub Title (in English) | |
Keyword(1) | triple data encryption standard |
Keyword(2) | side-channel attacks |
Keyword(3) | scan chain |
Keyword(4) | scan-based attack |
1st Author's Name | Hirokazu KODERA |
1st Author's Affiliation | Grad. of Fundamental Science and Engineering, Waseda University() |
2nd Author's Name | Masao YANAGISAWA |
2nd Author's Affiliation | Grad. of Fundamental Science and Engineering, Waseda University |
3rd Author's Name | Nozomu TOGAWA |
3rd Author's Affiliation | Grad. of Fundamental Science and Engineering, Waseda University |
Date | 2011-11-28 |
Paper # | VLD2011-53,DC2011-29 |
Volume (vol) | vol.111 |
Number (no) | 325 |
Page | pp.pp.- |
#Pages | 6 |
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