Presentation 2011-11-25
Bandwidth-Enhancement of the Measurement of Complex Near EM-field on PCBs by using 6-port Technique
Toshihiro TAKATSU, Kimitoshi MURANO, Yoshio KAMI, Fengchao XIAO,
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Abstract(in English) A bandwidth enhanced method for the measurement of complex electromagnetic (EM) field by using a 6-port network is proposed. The 6-port technique has been developed as an alternative constitution method for the vector network analyzer. It is a technique to estimate the S-parameters of a DUT by measuring powers at output ports of the 6-port network. Authors have applied the 6-port technique to the near field measurement. In particular, we have proposed a new 6-port network, where two voltage sources picked up by two EM probes are estimated in magnitude ratio and phase difference from powers measured at the output ports. In this report, an appropriate network constitution for the near field measurement method is described first. By applying the superheterodyne method to the 6-port network, the bandwidth of the measurement method has been enhanced.
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Keyword(in English) Complex EM field / 6-port network / scattering matrix / quadrature hybrid
Paper # EMCJ2011-90
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Conference Information
Committee EMCJ
Conference Date 2011/11/18(1days)
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Registration To Electromagnetic Compatibility (EMCJ)
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) Bandwidth-Enhancement of the Measurement of Complex Near EM-field on PCBs by using 6-port Technique
Sub Title (in English)
Keyword(1) Complex EM field
Keyword(2) 6-port network
Keyword(3) scattering matrix
Keyword(4) quadrature hybrid
1st Author's Name Toshihiro TAKATSU
1st Author's Affiliation University of Electro-Communications()
2nd Author's Name Kimitoshi MURANO
2nd Author's Affiliation Tokai University
3rd Author's Name Yoshio KAMI
3rd Author's Affiliation University of Electro-Communications
4th Author's Name Fengchao XIAO
4th Author's Affiliation University of Electro-Communications
Date 2011-11-25
Paper # EMCJ2011-90
Volume (vol) vol.111
Number (no) 319
Page pp.pp.-
#Pages 6
Date of Issue