Presentation 2011-10-28
Analytical Investigation of Regeneration Performance of an All-optical T-type Flop-Flop Circuit using SOA-MZIs
Satoshi SHIMIZU, Hiroyuki UENOHARA,
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Abstract(in English) We have investigated the operation possibility of an all-optical T-type flip-flop circuit (T-FF) for achieving the all-optical signal regenerator for DPSK code at a bit rate beyond 10Gbps, which consists of phase modulation to intensity modulation conversion using a delay interferometer, a DPSK encoder with a T-FF using SOA-MZIs, and an intensity modulation to phase modulation converter. Fundamental characteristics have been investigated analytically and experimentally, but its regeneration performance has not been examined so far. In this report, we analyzed the regeneration performance by simulating Q-values. In transmission model, optical loss in optical fibers, optical gain of EDFAs, and ASE noise with Gaussian distribution in both amplitude and phase were taken into consideration. Transmitted signal through several spans with each span length of 100km was input to the T-FF, and Q values of input and output signals were analyzed. Possibility of regeneration will be presented.
Keyword(in Japanese) (See Japanese page)
Keyword(in English) all-optical signal regenerator / DPSK / T-type flip-flop / SOA-MZI
Paper # OCS2011-78,OPE2011-116,LQE2011-79
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Committee OCS
Conference Date 2011/10/20(1days)
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Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) Analytical Investigation of Regeneration Performance of an All-optical T-type Flop-Flop Circuit using SOA-MZIs
Sub Title (in English)
Keyword(1) all-optical signal regenerator
Keyword(2) DPSK
Keyword(3) T-type flip-flop
Keyword(4) SOA-MZI
1st Author's Name Satoshi SHIMIZU
1st Author's Affiliation Photonics Integration System Research Center, Precision and Intelligence Laboratory, Tokyo Institute of Technology()
2nd Author's Name Hiroyuki UENOHARA
2nd Author's Affiliation Photonics Integration System Research Center, Precision and Intelligence Laboratory, Tokyo Institute of Technology
Date 2011-10-28
Paper # OCS2011-78,OPE2011-116,LQE2011-79
Volume (vol) vol.111
Number (no) 265
Page pp.pp.-
#Pages 4
Date of Issue