| Presentation | 2011-10-26 Improvement of the Worst ACK/NACK Bit Error Performance for LTE-Advanced Channel Selection Toru OIZUMI, Tadashi YOSHIDA, Seigo NAKAO, Daichi Imamura, |
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| PDF Download Page |  PDF download Page Link |
| Abstract(in Japanese) | (See Japanese page) |
| Abstract(in English) | 3GPP introduces Carrier Aggregation (CA) which allows expanding effective bandwidth delivered to a user through concurrent utilization of Component Carriers (CC) in LTE-Advanced system. 3GPP further introduces channel selection which allows multiple ACK/NACK (A/N) transmission. In channel selection, multiple A/N bits are mapped to corresponding PUCCH resource and symbol position which are decided based on A/N mapping. Hence A/N bit error rate varies depending on the A/N mapping. In this paper, we propose a new A/N mapping which can improve the worst NACK-to-ACK error rate among A/N bits through utilization of PUCCH resource based A/N decision on base station side. |
| Keyword(in Japanese) | (See Japanese page) |
| Keyword(in English) | LTE-Advanced / Carrier Aggregation / Channel selection / HARQ-ACK |
| Paper # | RCS2011-141 |
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| Conference Information | |
| Committee | RCS |
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| Conference Date | 2011/10/19(1days) |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | |
| Topics (in Japanese) | (See Japanese page) |
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| Paper Information | |
| Registration To | Radio Communication Systems (RCS) |
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| Language | JPN |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | Improvement of the Worst ACK/NACK Bit Error Performance for LTE-Advanced Channel Selection |
| Sub Title (in English) | |
| Keyword(1) | LTE-Advanced |
| Keyword(2) | Carrier Aggregation |
| Keyword(3) | Channel selection |
| Keyword(4) | HARQ-ACK |
| 1st Author's Name | Toru OIZUMI |
| 1st Author's Affiliation | Tokyo R&D Center, Panasonic Corporation() |
| 2nd Author's Name | Tadashi YOSHIDA |
| 2nd Author's Affiliation | Eco Solution Technology Center, Panasonic Mobile Communication R&D Lab. Co., Ltd |
| 3rd Author's Name | Seigo NAKAO |
| 3rd Author's Affiliation | Tokyo R&D Center, Panasonic Corporation |
| 4th Author's Name | Daichi Imamura |
| 4th Author's Affiliation | Tokyo R&D Center, Panasonic Corporation |
| Date | 2011-10-26 |
| Paper # | RCS2011-141 |
| Volume (vol) | vol.111 |
| Number (no) | 260 |
| Page | pp.pp.- |
| #Pages | 6 |
| Date of Issue | |