Presentation 2011-10-20
Statistical Evaluations of Generation and Recovery Characteristics of Anomalous Stress Induced Leakage Current
Takuya INATSUKA, Yuki KUMAGAI, Rihito KURODA, Akinobu TERAMOTO, Shigetoshi SUGAWA, Tadahiro OHMI,
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Abstract(in English) We have statistically evaluated anomalous stress induced leakage current (SILC) which is generated by electric stress applied to gate oxide. Anomalous SILC indicates much larger current density than average SILC, which is critical problem to Flash memories. Our previous study has reported discrete generation and recovery of anomalous SILC which depend on measurement temperature and stress time. In this paper we have investigated characteristics of anomalous SILC in time domain to clarify that recovery characteristics are much different between normal and anomalous SILCs. Furthermore we have investigated dependences of recovery tendencies on temperature and stress conditions.
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Keyword(in English) anomalous SILC / random telegraph signal / recovery
Paper # SDM2011-99
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Committee SDM
Conference Date 2011/10/13(1days)
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Registration To Silicon Device and Materials (SDM)
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) Statistical Evaluations of Generation and Recovery Characteristics of Anomalous Stress Induced Leakage Current
Sub Title (in English)
Keyword(1) anomalous SILC
Keyword(2) random telegraph signal
Keyword(3) recovery
1st Author's Name Takuya INATSUKA
1st Author's Affiliation Graduate School of Engineering, Tohoku University()
2nd Author's Name Yuki KUMAGAI
2nd Author's Affiliation Graduate School of Engineering, Tohoku University
3rd Author's Name Rihito KURODA
3rd Author's Affiliation Graduate School of Engineering, Tohoku University
4th Author's Name Akinobu TERAMOTO
4th Author's Affiliation New Industry Creation Hatchery Center, Tohoku University
5th Author's Name Shigetoshi SUGAWA
5th Author's Affiliation Graduate School of Engineering, Tohoku University:New Industry Creation Hatchery Center, Tohoku University
6th Author's Name Tadahiro OHMI
6th Author's Affiliation New Industry Creation Hatchery Center, Tohoku University
Date 2011-10-20
Paper # SDM2011-99
Volume (vol) vol.111
Number (no) 249
Page pp.pp.-
#Pages 6
Date of Issue