Presentation 2011-10-21
On The Extended Cumulative Exposure Model, ECEM
Hideo HIROSE, Takenori SAKUMURA,
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Abstract(in English) The cumulative exposure model (GEM) is often used to express the failure probability model in the step-up test method ; the step-up procedure continues until a breakdown occurs. This probability model is widely accepted in reliability fields because accumulation of fatigue is considered to be reasonable. Contrary to this, the memoryless model (MM) is also used in electrical engineering because accumulation of fatigue is not observed in some cases. We propose here a new model, the extended cumulative exposure model (ECEM), which includes features of both the described models. A simulation study and an application to the actual experimental case of oil insulation test support the validity of the proposed model. The independence model (IM) is also discussed.
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Keyword(in English) step-up tests / cumulative exposure model / memoryless model / extended cumulative exposure model / independence model
Paper # R2011-32
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Committee R
Conference Date 2011/10/14(1days)
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Language ENG
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) On The Extended Cumulative Exposure Model, ECEM
Sub Title (in English)
Keyword(1) step-up tests
Keyword(2) cumulative exposure model
Keyword(3) memoryless model
Keyword(4) extended cumulative exposure model
Keyword(5) independence model
1st Author's Name Hideo HIROSE
1st Author's Affiliation Graduate School of Information Sciences and Engineering, Kyushu Institute of Technology()
2nd Author's Name Takenori SAKUMURA
2nd Author's Affiliation Graduate School of Information Sciences and Engineering, Kyushu Institute of Technology
Date 2011-10-21
Paper # R2011-32
Volume (vol) vol.111
Number (no) 253
Page pp.pp.-
#Pages 6
Date of Issue