Presentation | 2011-10-21 On The Extended Cumulative Exposure Model, ECEM Hideo HIROSE, Takenori SAKUMURA, |
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Abstract(in Japanese) | (See Japanese page) |
Abstract(in English) | The cumulative exposure model (GEM) is often used to express the failure probability model in the step-up test method ; the step-up procedure continues until a breakdown occurs. This probability model is widely accepted in reliability fields because accumulation of fatigue is considered to be reasonable. Contrary to this, the memoryless model (MM) is also used in electrical engineering because accumulation of fatigue is not observed in some cases. We propose here a new model, the extended cumulative exposure model (ECEM), which includes features of both the described models. A simulation study and an application to the actual experimental case of oil insulation test support the validity of the proposed model. The independence model (IM) is also discussed. |
Keyword(in Japanese) | (See Japanese page) |
Keyword(in English) | step-up tests / cumulative exposure model / memoryless model / extended cumulative exposure model / independence model |
Paper # | R2011-32 |
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Conference Information | |
Committee | R |
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Conference Date | 2011/10/14(1days) |
Place (in Japanese) | (See Japanese page) |
Place (in English) | |
Topics (in Japanese) | (See Japanese page) |
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Paper Information | |
Registration To | Reliability(R) |
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Language | ENG |
Title (in Japanese) | (See Japanese page) |
Sub Title (in Japanese) | (See Japanese page) |
Title (in English) | On The Extended Cumulative Exposure Model, ECEM |
Sub Title (in English) | |
Keyword(1) | step-up tests |
Keyword(2) | cumulative exposure model |
Keyword(3) | memoryless model |
Keyword(4) | extended cumulative exposure model |
Keyword(5) | independence model |
1st Author's Name | Hideo HIROSE |
1st Author's Affiliation | Graduate School of Information Sciences and Engineering, Kyushu Institute of Technology() |
2nd Author's Name | Takenori SAKUMURA |
2nd Author's Affiliation | Graduate School of Information Sciences and Engineering, Kyushu Institute of Technology |
Date | 2011-10-21 |
Paper # | R2011-32 |
Volume (vol) | vol.111 |
Number (no) | 253 |
Page | pp.pp.- |
#Pages | 6 |
Date of Issue |