Presentation 2011-10-21
Measurements of Complex Permittivity Anisotropy in Plane of Sapphire Substrates
Shuhei Wadayama, Yoshio Kobayashi, Zhewang MA,
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Abstract(in English) We proposed a measurement method to evaluate complex permittivity anisotropy in plane for dielectric laminate substrates, using the TE_<111> mode in a circular cavity. In this paper, we measured complex permittivity anisotropy in plane for R-plane-cut sapphire substrates used for superconductive micro wave device. As a result, it was verified that this measurement method is useful for materials which have big relative permittivity anisotropy in plane.
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Keyword(in English) Sapphire / Complex Permittivity / Anisotropy in Plane / Circular Cavity Resonator / TE<111> mode / TE_<011> mode
Paper # MW2011-102
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Committee MW
Conference Date 2011/10/13(1days)
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Language JPN
Title (in Japanese) (See Japanese page)
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Title (in English) Measurements of Complex Permittivity Anisotropy in Plane of Sapphire Substrates
Sub Title (in English)
Keyword(1) Sapphire
Keyword(2) Complex Permittivity
Keyword(3) Anisotropy in Plane
Keyword(4) Circular Cavity Resonator
Keyword(5) TE<111> mode
Keyword(6) TE_<011> mode
1st Author's Name Shuhei Wadayama
1st Author's Affiliation Faculty of Engineering, Saitama University()
2nd Author's Name Yoshio Kobayashi
2nd Author's Affiliation SUMTEC, Inc., Comprehensive Open Innovation Center, Saitama University
3rd Author's Name Zhewang MA
3rd Author's Affiliation SUMTEC, Inc., Comprehensive Open Innovation Center, Saitama University
Date 2011-10-21
Paper # MW2011-102
Volume (vol) vol.111
Number (no) 250
Page pp.pp.-
#Pages 6
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