Presentation | 2011-10-21 Measurements of Complex Permittivity Anisotropy in Plane of Sapphire Substrates Shuhei Wadayama, Yoshio Kobayashi, Zhewang MA, |
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Abstract(in Japanese) | (See Japanese page) |
Abstract(in English) | We proposed a measurement method to evaluate complex permittivity anisotropy in plane for dielectric laminate substrates, using the TE_<111> mode in a circular cavity. In this paper, we measured complex permittivity anisotropy in plane for R-plane-cut sapphire substrates used for superconductive micro wave device. As a result, it was verified that this measurement method is useful for materials which have big relative permittivity anisotropy in plane. |
Keyword(in Japanese) | (See Japanese page) |
Keyword(in English) | Sapphire / Complex Permittivity / Anisotropy in Plane / Circular Cavity Resonator / TE<111> mode / TE_<011> mode |
Paper # | MW2011-102 |
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Committee | MW |
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Conference Date | 2011/10/13(1days) |
Place (in Japanese) | (See Japanese page) |
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Paper Information | |
Registration To | Microwaves (MW) |
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Language | JPN |
Title (in Japanese) | (See Japanese page) |
Sub Title (in Japanese) | (See Japanese page) |
Title (in English) | Measurements of Complex Permittivity Anisotropy in Plane of Sapphire Substrates |
Sub Title (in English) | |
Keyword(1) | Sapphire |
Keyword(2) | Complex Permittivity |
Keyword(3) | Anisotropy in Plane |
Keyword(4) | Circular Cavity Resonator |
Keyword(5) | TE<111> mode |
Keyword(6) | TE_<011> mode |
1st Author's Name | Shuhei Wadayama |
1st Author's Affiliation | Faculty of Engineering, Saitama University() |
2nd Author's Name | Yoshio Kobayashi |
2nd Author's Affiliation | SUMTEC, Inc., Comprehensive Open Innovation Center, Saitama University |
3rd Author's Name | Zhewang MA |
3rd Author's Affiliation | SUMTEC, Inc., Comprehensive Open Innovation Center, Saitama University |
Date | 2011-10-21 |
Paper # | MW2011-102 |
Volume (vol) | vol.111 |
Number (no) | 250 |
Page | pp.pp.- |
#Pages | 6 |
Date of Issue |