Presentation 2011-10-20
Ion Bombardment Simulation of Ba Dispenser Cathodes for Electron Tubes
Toshiharu HIGUCHI, Masahiro SASAKI, Shuji MATSUMOTO, Shigeki FUKUDA,
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Abstract(in English) We have developed the simulation method for emission distribution on the cathode surface under ion bombardment due to ionized residual gas. The simulation results for both klystron and CRT guns show that ion bombardment damage on the cathode center are more serious than the periphery.
Keyword(in Japanese) (See Japanese page)
Keyword(in English) Ion Bombardment / Emission Slump / Ba Dispenser Cathodes / Impregnated Cathodes / Electron Gun / Klystron / Cathode Ray Tubes
Paper # ED2011-62
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Committee ED
Conference Date 2011/10/13(1days)
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Paper Information
Registration To Electron Devices (ED)
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) Ion Bombardment Simulation of Ba Dispenser Cathodes for Electron Tubes
Sub Title (in English)
Keyword(1) Ion Bombardment
Keyword(2) Emission Slump
Keyword(3) Ba Dispenser Cathodes
Keyword(4) Impregnated Cathodes
Keyword(5) Electron Gun
Keyword(6) Klystron
Keyword(7) Cathode Ray Tubes
1st Author's Name Toshiharu HIGUCHI
1st Author's Affiliation Institute of Applied Physics, University of Tsukuba()
2nd Author's Name Masahiro SASAKI
2nd Author's Affiliation Institute of Applied Physics, University of Tsukuba
3rd Author's Name Shuji MATSUMOTO
3rd Author's Affiliation Accelerator Laboratory, High Energy Accelerator Research Organization
4th Author's Name Shigeki FUKUDA
4th Author's Affiliation Accelerator Laboratory, High Energy Accelerator Research Organization
Date 2011-10-20
Paper # ED2011-62
Volume (vol) vol.111
Number (no) 248
Page pp.pp.-
#Pages 6
Date of Issue