Presentation 2011-10-12
Development of Nb Multi-layer Advanced Process for Large-scale SFQ circuits
Shuichi NAGASAWA, Kenji HINODE, Tetsuro SATOH, Mutsuo HIDAKA, Akira FUJIMAKI, Hiroyuki AKAIKE, Yoshiyuki YOSHIKAWA, Kazuyoshi TAKAGI, Naofumi TAKAGI,
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Abstract(in English) We have been developing a Nb multi-layer fabrication process for large-scale SFQ circuits. We have been evaluating both diagnostic chips and shift register chips to improve reliability of the fabrication process. The diagnostic chip was designed to evaluate the characteristics of the basic elements such as junctions, contacts, resisters, and wirings in addition to their defect evaluations. The shift register chip was designed to evaluate defects in real SFQ circuits and defects depending circuit size. We discuss a correlation of defects between the diagnostic chips and the shift register chips, and describe detail of the measurement results of the shift register chips to investigate the many possible causes of the problems and improving reliability in our fabrication process.
Keyword(in Japanese) (See Japanese page)
Keyword(in English) SFQ Circuit / Superconducting Integrated Circuit / Fabrication Process / Multi-layer Structure / Niobium / Shift Register
Paper # SCE2011-18
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Conference Information
Committee SCE
Conference Date 2011/10/5(1days)
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Paper Information
Registration To Superconductive Electronics (SCE)
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) Development of Nb Multi-layer Advanced Process for Large-scale SFQ circuits
Sub Title (in English)
Keyword(1) SFQ Circuit
Keyword(2) Superconducting Integrated Circuit
Keyword(3) Fabrication Process
Keyword(4) Multi-layer Structure
Keyword(5) Niobium
Keyword(6) Shift Register
1st Author's Name Shuichi NAGASAWA
1st Author's Affiliation Superconductivity Research Laboratory, ISTEC:CREST-JST()
2nd Author's Name Kenji HINODE
2nd Author's Affiliation Superconductivity Research Laboratory, ISTEC:CREST-JST
3rd Author's Name Tetsuro SATOH
3rd Author's Affiliation Superconductivity Research Laboratory, ISTEC:CREST-JST
4th Author's Name Mutsuo HIDAKA
4th Author's Affiliation Superconductivity Research Laboratory, ISTEC:CREST-JST
5th Author's Name Akira FUJIMAKI
5th Author's Affiliation Nagoya University:CREST-JST
6th Author's Name Hiroyuki AKAIKE
6th Author's Affiliation Nagoya University:CREST-JST
7th Author's Name Yoshiyuki YOSHIKAWA
7th Author's Affiliation Yokohama National University:CREST-JST
8th Author's Name Kazuyoshi TAKAGI
8th Author's Affiliation Kyoto University:CREST-JST
9th Author's Name Naofumi TAKAGI
9th Author's Affiliation Kyoto University:CREST-JST
Date 2011-10-12
Paper # SCE2011-18
Volume (vol) vol.111
Number (no) 230
Page pp.pp.-
#Pages 6
Date of Issue