Presentation 2011-10-12
Development of AC Programmable Josephson Voltage Standard
Michitaka MARUYAMA, Chiharu URANO, Takahiro YAMADA, Hirotake YAMAMORI, Nobu-hisa KANEKO,
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Abstract(in English) Josephson voltage standard (JVS) systems are widely used for the calibration of DC voltage in National Metrology Institutes (NMIs) in the world. On the other hand, many challenges for extending the ability of JVS to handle AC voltage have being done. These challenges have a history of 20 years, and a lot of knowledge has been built up. Now the AC-JVS is coming to the practical field; various applications and the high-precision test results are reported. As one of the promising methods for realizing AC voltage standard based on Josephson effect, this paper reports, with our latest experimental results, the present status and the prospective views about our development of AC programmable Josephson voltage standard (ACPJVS).
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Keyword(in English) AC Voltage / Voltage Standard / Programmable / Josephson Effect
Paper # SCE2011-16
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Conference Information
Committee SCE
Conference Date 2011/10/5(1days)
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Paper Information
Registration To Superconductive Electronics (SCE)
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) Development of AC Programmable Josephson Voltage Standard
Sub Title (in English)
Keyword(1) AC Voltage
Keyword(2) Voltage Standard
Keyword(3) Programmable
Keyword(4) Josephson Effect
1st Author's Name Michitaka MARUYAMA
1st Author's Affiliation National Institute of Advanced Industrial Science and Technology (AIST)()
2nd Author's Name Chiharu URANO
2nd Author's Affiliation National Institute of Advanced Industrial Science and Technology (AIST)
3rd Author's Name Takahiro YAMADA
3rd Author's Affiliation National Institute of Advanced Industrial Science and Technology (AIST)
4th Author's Name Hirotake YAMAMORI
4th Author's Affiliation National Institute of Advanced Industrial Science and Technology (AIST)
5th Author's Name Nobu-hisa KANEKO
5th Author's Affiliation National Institute of Advanced Industrial Science and Technology (AIST)
Date 2011-10-12
Paper # SCE2011-16
Volume (vol) vol.111
Number (no) 230
Page pp.pp.-
#Pages 6
Date of Issue