Presentation 2011-10-12
Capacitance measurements of sub-micron Al junctions using SQUID resonance
Kento KIKUCHI, Masataka MORIYA, Hiroshi SHIMADA, Yoshinao MIZUGAKI,
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Abstract(in English) It is necessary to extract the capacitances, resistances and inductances experimentally for fabrication sub-micron Al junction device. We have obtained these device parameters using SQUID resonance techniques with sub-micron Al junctions evaluated by means of direct current injections. The results of capacitance are 54~170fF/μm^2.
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Keyword(in English) Superconductor / Josephson effects / SQUID / tunnel junction / inductance, capacitance
Paper # SCE2011-13
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Committee SCE
Conference Date 2011/10/5(1days)
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Registration To Superconductive Electronics (SCE)
Language JPN
Title (in Japanese) (See Japanese page)
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Title (in English) Capacitance measurements of sub-micron Al junctions using SQUID resonance
Sub Title (in English)
Keyword(1) Superconductor
Keyword(2) Josephson effects
Keyword(3) SQUID
Keyword(4) tunnel junction
Keyword(5) inductance, capacitance
1st Author's Name Kento KIKUCHI
1st Author's Affiliation Department of Electro Engineering, The Univercity of Electro Communications()
2nd Author's Name Masataka MORIYA
2nd Author's Affiliation Department of Engineering Science, The Univercity of Electro Communications
3rd Author's Name Hiroshi SHIMADA
3rd Author's Affiliation Department of Engineering Science, The Univercity of Electro Communications
4th Author's Name Yoshinao MIZUGAKI
4th Author's Affiliation Department of Engineering Science, The Univercity of Electro Communications
Date 2011-10-12
Paper # SCE2011-13
Volume (vol) vol.111
Number (no) 230
Page pp.pp.-
#Pages 6
Date of Issue