Presentation | 2011-10-06 A Study of Electromagnetic Modeling of GSG Probes for On-Wafer Measurement Takuichi HIRANO, Kenichi OKADA, Jiro HIROKAWA, Makoto ANDO, |
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Abstract(in Japanese) | (See Japanese page) |
Abstract(in English) | On-chip analog RF circuits are measured using GSG probes by contacting them onto pads. Electromagnetic simulation modeling including pads is sometimes necessary. The authors had reported electromagnetic simulation modeling for excitations using GSG pads with symmetric circuit, and the validity was confirmed by measurement. In this report, the previous work is extended, and electromagnetic simulation modeling for the circuit without symmetry is investigated. |
Keyword(in Japanese) | (See Japanese page) |
Keyword(in English) | Electromagnetic Analysis Modeling / GSG Probe / Pad / On-Wafer Measurement / Millimeter-Wave / CMOS |
Paper # | EST2011-67 |
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Committee | EST |
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Conference Date | 2011/9/29(1days) |
Place (in Japanese) | (See Japanese page) |
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Registration To | Electronic Simulation Technology (EST) |
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Language | JPN |
Title (in Japanese) | (See Japanese page) |
Sub Title (in Japanese) | (See Japanese page) |
Title (in English) | A Study of Electromagnetic Modeling of GSG Probes for On-Wafer Measurement |
Sub Title (in English) | |
Keyword(1) | Electromagnetic Analysis Modeling |
Keyword(2) | GSG Probe |
Keyword(3) | Pad |
Keyword(4) | On-Wafer Measurement |
Keyword(5) | Millimeter-Wave |
Keyword(6) | CMOS |
1st Author's Name | Takuichi HIRANO |
1st Author's Affiliation | Graduate School of Science and Engineering, Tokyo Institute of Technology() |
2nd Author's Name | Kenichi OKADA |
2nd Author's Affiliation | Graduate School of Science and Engineering, Tokyo Institute of Technology |
3rd Author's Name | Jiro HIROKAWA |
3rd Author's Affiliation | Graduate School of Science and Engineering, Tokyo Institute of Technology |
4th Author's Name | Makoto ANDO |
4th Author's Affiliation | Graduate School of Science and Engineering, Tokyo Institute of Technology |
Date | 2011-10-06 |
Paper # | EST2011-67 |
Volume (vol) | vol.111 |
Number (no) | 224 |
Page | pp.pp.- |
#Pages | 6 |
Date of Issue |