Presentation 2011/8/18
Study of pattern area for reconfigurable logic circuit with DG/CNT transistor
Takamichi HAYASHI, Shigeyoshi WATANABE,
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Abstract(in English) Pattern area for 2~6 input reconfigurable logic circuit with double-gate (DG), Carbon-Nano-Tube (CNT), double-gate and Carbon-Nano-Tube (DG and CNT) has been newly estimated. Pattern area and number of logic dependence on input number of logic circuit has been analyzed.
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Keyword(in English) MOS double gate transistor / CNT transistor / reconfigurable logic / logic circuit / pattern area
Paper # ICD2011-41,SDM2011-73
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Committee ICD
Conference Date 2011/8/18(1days)
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Registration To Integrated Circuits and Devices (ICD)
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) Study of pattern area for reconfigurable logic circuit with DG/CNT transistor
Sub Title (in English)
Keyword(1) MOS double gate transistor
Keyword(2) CNT transistor
Keyword(3) reconfigurable logic
Keyword(4) logic circuit
Keyword(5) pattern area
1st Author's Name Takamichi HAYASHI
1st Author's Affiliation Department of Engineering Research, Shonan Institute of Technology()
2nd Author's Name Shigeyoshi WATANABE
2nd Author's Affiliation Department of Information Science, Shonan Institute of Technology
Date 2011/8/18
Paper # ICD2011-41,SDM2011-73
Volume (vol) vol.111
Number (no) 188
Page pp.pp.-
#Pages 4
Date of Issue